At the Materials Research Society (MRS) Fall 2011 Meeting, Bruker announced today the release of the Innova-IRIS, an integrated system for correlated atomic force microscopy and Raman spectroscopic imaging.
Its unique combination of ultra-low closed loop noise, no-drift mechanical stability, and wide-open optical access make the Innova AFM a uniquely suitable platform for challenging Tip-Enhanced Raman Spectroscopy (TERS) research. With hardware integration specifically designed to accelerate a TERS setup, and an IRIS software module that offers automated mapping, the system transforms today's leading AFM and Raman instruments into a proven TERS-enabled research platform.
"Researchers have had to accept severe performance limitations to combine atomic force microscopy with Raman spectroscopy, and there has been a real need for commercial products that allow more scientists to perform these complementary techniques with the highest level of performance," said Mark R. Munch, Ph.D., President of the Bruker Nano Surfaces Division. "Our extensive AFM expertise and collaboration with leading Raman spectrometer manufacturers have allowed us to develop seamlessly integrated AFM-Raman systems that can be tailored to specific application requirements, allowing researchers to concentrate on the data rather than the nuances of the technologies."
"Recent Bruker innovations have revolutionized AFM by making it dramatically easier to use while also providing quantitative material property information," added David Rossi, Vice President and General Manager of Bruker's AFM Business. "With the Innova-IRIS systems, Bruker has taken the next step, providing solutions for routinely correlating AFM nanoscale property maps with Raman chemical images to address nanoscale materials analysis applications, and enabling TERS research to extend the frontiers of science."
About the Innova-IRIS
The Innova-IRIS model leverages the leading performance and unique AFM head design of the Innova platform to provide TERS-ready AFM-Raman integration suitable for the sensitive interrogation of opaque samples. It is compatible with leading Raman systems and implements the optimized off-axis Raman geometry necessary for maximum sensitivity. With multiple simultaneous optical views, simplified approach curves for TERS signal evaluation, and automated mapping, the integration accelerates setup and data acquisition. At the same time, the integration preserves the leading performance and capabilities of each instrument in separate operation and provides fully featured analysis packages for the AFM and Raman data.