Bruker's Nano Surfaces Division will be exhibiting the latest innovations in fluorescence and atomic force microscopy at MMC 2014.
Registration for the MMC exhibition is still open, and free of charge. You can register and get more information
Dimension FastScan AFM and Opterra Multipoint Scanning Confocal Microscope
Attendees can bring their own samples to the Bruker Nano Surfaces booth (#705) for inspection with the Dimension FastScan AFM and Opterra Multipoint Scanning Confocal Microscope. Samples will be run on a first-come first-served basis - contact Bruker
here to reserve a place.
Bruker will also be running a program of FREE workshops for all attendees - no pre-registration necessary. Details of the workshops are as follows:
“Opterra-the New Way of Multipoint Confocal Imaging”
On Tuesday 1st July from 16h30 to 17h15 (workshop area 2)
“Mapping receptor over living cell by Peak Force Tapping”
On Wednesday 2nd July from 13h15 to 14h00 (workshop area 4)
“High resolution & mechanical mapping over polymer by AFM”
On Wednesday 2nd July from 1400 to 14h45 (workshop area 4)
About Bruker Nano Surfaces
From leading edge scientific research to high-speed production,
Bruker provides the critical surface measurements necessary for success with the world's broadest range of AFMs, stylus profilers, mechanical testers, non-contact 3D optical microscopes, and fluorescence optical microscopes.
Bruker's extensive suite of application-focused AFM and 3D optical instrumentation addresses the full range of metrology techniques, sample sizes, imaging resolutions, and analysis software.
Bruker fluoresent optical microscopes provide the resolution, reliability, flexibility and ease of use required by today's life science research community. Bruker's production-ready tools help solve crucial inspection and QA issues, while anticipating the next generation of needs and standards.
About MMC 2014
Combining the very best of the 2012 European Microscopy Congress and the MICROSCIENCE International Conference and Exhibition series, the Royal Microscopical Society is proud to present the Microscience Microscopy Congress 2014.
The Microscience Microscopy Congress 2014 will feature -
an international conference of four parallel sessions
a huge exhibition
a fully-equipped teaching and learning zone
the RMS International Scientific Imaging Competition.
mmc2014 will also include the annual UK Scanning Probe Microscopy Meeting, Frontiers in Bioimaging, a session on advanced electron microscopy convened by the Electron Microscopy and Analysis Group (EMAG) of the Institute of Physics and two sessions on Advanced Measurements in Technology in the 21st Century.