Search

Search Results
Results 91 - 100 of 826 for A-Si
  • Supplier Profile
    Elmarco is the industry's first supplier of industrial scale nanofiber production equipment. Partnerships with global industrial leaders and universities form the foundation for success of the...
  • Supplier Profile
    The Microscopy business group at Carl Zeiss is the world's only manufacturer of light, X-ray, electron, and ion microscopes. The company's extensive portfolio enables industrial, research and...
  • Supplier Profile
    Zurich Instruments is a test and measurement company based in Zurich, Switzerland, developing and selling measurement instruments and delivering customer support in key markets around the world,...
  • Supplier Profile
    CPI is the driving force behind a number of the North East's strategic R&D initiatives. Each of CPI' programmes focuses on bringing cutting edge technology research to the region, which...
  • News - 11 Jan 2024
    Semiconductor packaging technologies have evolved from initial 1D PCB levels to the cutting-edge 3D hybrid bonding packaging at the wafer level. This advancement facilitates single-digit micronmeter...
  • News - 5 Aug 2022
    Portable electronic devices raised the demand for supercapacitors with high power density and mechanical flexibility within a finite area. However, currently commercialized devices come with in-plane...
  • News - 4 Apr 2022
    In an article published in the journal ACS Applied Nano Materials, the optical characteristics of silicon (Si) micropyramids (MPs) were explored. It was discovered that nanoscale metallic films...
  • News - 11 Jun 2010
    Research and Markets (http://www.researchandmarkets.com/research/cb750b/2010_deep_research) has announced the addition of the "2010 Deep Research Report on Global and China Thin Film Solar Cell...
  • Article - 26 May 2008
    Spectroscopic ellipsometry characterizes TFT-LCD panels, assessing a-Si and LTPS layer thickness, optical constants, and p-Si grain size with high accuracy.
  • Article - 5 Oct 2006
    This article discusses in-situ electrical characterization during nanoindentation of crystalline silicon using nanoECR and Hysitron TriboIndenter.

While we only use edited and approved content for Azthena answers, it may on occasions provide incorrect responses. Please confirm any data provided with the related suppliers or authors. We do not provide medical advice, if you search for medical information you must always consult a medical professional before acting on any information provided.

Your questions, but not your email details will be shared with OpenAI and retained for 30 days in accordance with their privacy principles.

Please do not ask questions that use sensitive or confidential information.

Read the full Terms & Conditions.