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Results 91 - 100 of 819 for A-Si
  • Supplier Profile
    Elmarco is the industry's first supplier of industrial scale nanofiber production equipment. Partnerships with global industrial leaders and universities form the foundation for success of the...
  • Supplier Profile
    The Microscopy business group at Carl Zeiss is the world's only manufacturer of light, X-ray, electron, and ion microscopes. The company's extensive portfolio enables industrial, research and...
  • Supplier Profile
    Zurich Instruments is a test and measurement company based in Zurich, Switzerland, developing and selling measurement instruments and delivering customer support in key markets around the world,...
  • Supplier Profile
    CPI is the driving force behind a number of the North East's strategic R&D initiatives. Each of CPI' programmes focuses on bringing cutting edge technology research to the region, which...
  • News - 11 Jan 2024
    Semiconductor packaging technologies have evolved from initial 1D PCB levels to the cutting-edge 3D hybrid bonding packaging at the wafer level. This advancement facilitates single-digit micronmeter...
  • News - 5 Aug 2022
    Portable electronic devices raised the demand for supercapacitors with high power density and mechanical flexibility within a finite area. However, currently commercialized devices come with in-plane...
  • News - 4 Apr 2022
    In an article published in the journal ACS Applied Nano Materials, the optical characteristics of silicon (Si) micropyramids (MPs) were explored. It was discovered that nanoscale metallic films...
  • News - 11 Jun 2010
    Research and Markets (http://www.researchandmarkets.com/research/cb750b/2010_deep_research) has announced the addition of the "2010 Deep Research Report on Global and China Thin Film Solar Cell...
  • Article - 26 May 2008
    Spectroscopic ellipsometry characterizes TFT-LCD panels, assessing a-Si and LTPS layer thickness, optical constants, and p-Si grain size with high accuracy.
  • Article - 5 Oct 2006
    This article discusses in-situ electrical characterization during nanoindentation of crystalline silicon using nanoECR and Hysitron TriboIndenter.

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