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Results 31 - 40 of 1597 for Afm
  • Equipment
    NanoWorld Pointprobe® NCH probes are designed for non-contact or tapping™ mode imaging. This probe type combines high operation stability with outstanding sensitivity and fast scanning ability.
  • Equipment
    Our most versatile tip. It delivers excellent results in almost all AFM applications.
  • Equipment
    Applied NanoStructures’ FT product is cylindrical post with a flat top. The diameter and height can be changed to match the application.
  • Equipment
    Conductive diamond coated Si cantilever for contact mode, Al coating on reflex side, conductive diamond coating on tip side.
  • Equipment
    Novascan Technologies provides particle attachment to AFM probes. Our expericed technicians utilize a number of attachment methods for mounting particles ranging in size from 600 nm to 30 ì....
  • Supplier Profile
    KLA Instruments encompasses a broad portfolio of surface metrology and defect inspection solutions within the KLA Corporation. KLA Instruments is divided into the Labs group of primarily benchtop...
  • Supplier Profile
    Molecular Vista designs, develops, and provides tools that allow its customers to probe and understand matter at the molecular level through quantitative visualization. Its first product, VistaScope,...
  • News - 9 Aug 2011
    The Bruker Nano Surfaces division has launched a brand new website for atomic force microscopy (AFM) probes at www.brukerAFMprobes.com. Bruker, the company that has recently brought you Dimension...
  • Equipment
    The CoreAFM is the result of intelligently combining the core components of AFM to achieve maximum versatility and user-friendliness.
  • Article - 18 Oct 2016
    Atomic force microscopy (AFM) is one of the key methods that failure analysis engineers in data storage rely on to obtain 3D data about the topological defects on hard disk media samples.