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Results 31 - 40 of 1597 for Afm
  • Super Sharp Silicon AFM Tips from NanoWorld
    Equipment
    NanoWorld Pointprobe® NCH probes are designed for non-contact or tapping™ mode imaging. This probe type combines high operation stability with outstanding sensitivity and fast scanning ability.
  • Universal AFM Probes from Nanotools
    Equipment
    Our most versatile tip. It delivers excellent results in almost all AFM applications.
  • Flat Tip AFM Probe from Applied NanoStructures
    Equipment
    Applied NanoStructures’ FT product is cylindrical post with a flat top. The diameter and height can be changed to match the application.
  • Conductive Diamond Coated AFM Tip from NANOSENSORS
    Equipment
    Conductive diamond coated Si cantilever for contact mode, Al coating on reflex side, conductive diamond coating on tip side.
  • AFM Tips with Particle Attachment from Novascan
    Equipment
    Novascan Technologies provides particle attachment to AFM probes. Our expericed technicians utilize a number of attachment methods for mounting particles ranging in size from 600 nm to 30 ì....
  • KLA Instruments™
    Supplier Profile
    KLA Instruments encompasses a broad portfolio of surface metrology and defect inspection solutions within the KLA Corporation. KLA Instruments is divided into the Labs group of primarily benchtop...
  • Molecular Vista
    Supplier Profile
    Molecular Vista designs, develops, and provides tools that allow its customers to probe and understand matter at the molecular level through quantitative visualization. Its first product, VistaScope,...
  • Bruker Nano Surfaces Launch Online Store for AFM Probes
    News - 9 Aug 2011
    The Bruker Nano Surfaces division has launched a brand new website for atomic force microscopy (AFM) probes at www.brukerAFMprobes.com. Bruker, the company that has recently brought you Dimension...
  • CoreAFM — The Essence of AFM in a Compact System
    Equipment
    The CoreAFM is the result of intelligently combining the core components of AFM to achieve maximum versatility and user-friendliness.
  • Automatic Defect Review AFM for Hard Disk Media Failure Analysis
    Article - 18 Oct 2016
    Atomic force microscopy (AFM) is one of the key methods that failure analysis engineers in data storage rely on to obtain 3D data about the topological defects on hard disk media samples.