Article - 25 Feb 2019
In this article thin measurement on angled surfaces is discussed, how it can be done and what to expect and what you need to do it.
Article - 3 Sep 2018
You are looking to purchase a new scanning electron microscope (SEM), as you are aware of your need for increased SEM capability.
Article - 29 Aug 2017
The SEM-BASE VI is the next generation active piezoelectric vibration cancellation product. Designed to support commercial scanning electron microscopes.
Article - 15 Jan 2016
AZoNano spoke to their founder and CEO, Jan F. Jørgensen, about SPM, the information their SPIP™ software elucidates for researchers and the continued evolution of the semiconductor industry.
Article - 8 Jul 2013
There is a growing need for accurate vibration isolation with scanning probe microscopy (SPM) and nearfield scanning optical microscopy (NSOM) systems and is becoming highly critical as resolutions...
Article - 26 Apr 2019
In this interview, Rob Ellis, VP of Strategic Planning, for Lake Shore Cryotronics talks to AZoNano about their new product the MeasureReady™ M91 FastHall™ measurement controller is a revolutionary,...
Article - 22 Jan 2018
The 2018 Pittcon Conference & Expo is the ideal place to learn about the latest trends in nanotechnology and nanomaterial characterization.
Article - 3 May 2013
Virginia, situated in the South Atlantic region of the United States, had a population of 8,185,867 in 2012. The state is spread over a total area of 110,785.67 km2.
Article - 10 Aug 2010
Nanotechnological engineering, yet an infant in its growth is the promise of the future. Its developments bring with it the potential to completely revolutionize conventional sciences, providing an...
Article - 25 Feb 2008
This article examines the imaging of organic compounds, both natural and synthetic examples, such as alkanes, alkane derivatives and aromates using atomic force microscopy