Applied Nanostructures Silicon Probes

Applied Nanostructures Silicon Probes are available in different configurations such as long and short cantilever for tapping and non-contact mode applications, multi-cantilever probes for force calibration, probes for force modulation microscopy, probes for contact applications and probes with varying degrees of tilt compensation.

Applications of Applied Nanostructures Silicon Probes include:

  • Direct optical view of the AFM tip
  • Tapping, contact and non-contact mode applications
  • Spring constant calibration of SPM probes
  • Force Modulation Microscopy
  • Imaging or Trench Depth Metrology.
Ask A Question

Do you have a question you'd like to ask the manufacturer of this equipment or can you provide feedback regarding your use of this equipment?

Leave your feedback
Other Equipment by this Supplier
Other Equipment