Flat Tip AFM Probe from Applied NanoStructures

Applied NanoStructures’ FT product is cylindrical post with a flat top. The diameter and height can be changed to match the application. The post can also be incorporated into any cantilever design. The flat top can also be made with tilt compensation angles. The probe can be used in assorted fluid applications or coated with metal for electrical measurement.
Ask A Question

Do you have a question you'd like to ask the manufacturer of this equipment or can you provide feedback regarding your use of this equipment?

Leave your feedback
Other Equipment by this Supplier
Other Equipment