Flat Tip AFM Probe from Applied NanoStructures

Flat Tip AFM Probe from Applied NanoStructures
Applied NanoStructures’ FT product is cylindrical post with a flat top. The diameter and height can be changed to match the application. The post can also be incorporated into any cantilever design. The flat top can also be made with tilt compensation angles. The probe can be used in assorted fluid applications or coated with metal for electrical measurement.
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