Super Sharp 1nm NT-MDT AFM Probes from Scanwel

Super sharp diamond-like carbon (DLC) tips* with typical curvature radius 1nm are extremely useful for obtaining high resolution on object with sizes of several nanometers. DLC tips have very long lifetime due to the high material durability.

DLC tips can be grown on any standard probe series.

To guarantee 20 nm working length of DLC tips TEM is used. 10% from total number of probes in the branch are selected for testing. At least 80% of those probes should have the only DLC tip which length is exceeded by 20 nm others DLC tips on the same probe. In this case the whole batch is considered as passed the TEM test. On the surfaces with roughness bigger than 20 nm double images are possible.

Super sharp DLC tip specifications:

  • Material - Diamond-like carbon
  • Curvature radius - 1-3nm
  • Working length - >20nm

Probe specifications:

  • Chip size - 3.6x1.6x0.4mm3
  • Reflective side coating - Au
  • Chip has one rectangular cantilever

Probe Series
Cantilever Length, L+5μm
Cantilever width, W+3μm
Cantilever Thickness, μm
Resonant Frequency, kHz
Force Constant, N/m
min
typical
max
min
typical
max
min
typical
max
NSG01*
130
35
1.7
2.0
2.3
115
150
190
2.5
5.5
10

* - DLC tips can be grown on any other probe series by request

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