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NT-MDT Probes for CONTACT/SEMICONTACT from Scanwel

Due to the medium values of force constant and resonant frequency the CSG30 series probes from NT-MDT can be used in contact, semicontact and noncontact mode.

Specifically designed for applications when it's not clearly defined which mode should be used, for sample investigation or when it's necessary to provide measurements in both modes of the same sample area without removing the tip.

CSG30 Series, Probe specifications:

  • Material - Single Crystal Silicon, N-type, 0.01-0.025 Ohm-cm, Antimony doped
  • Chip size - 3.4x1.6x0.3mm3
  • Reflective side - Au
  • Cantilever number - 1 rectangular
  • Tip curvature radius - typical 6nm, guaranteed 10nm
  • Available coatings - Conductive PtIr
  • Available probe - bare, tipless, with Al reflective coating

Cantilever Series
Cantilever Length, L+5μm
Cantilever width, W+3μm
Cantilever Thickness, T+0.5μm
Resonant Frequency, kHz
Force Constant, N/m
min
typical
max
min
typical
max
CSG30
190
30
1.5
26
48
76
0.13
0.6
2

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