Super Sharp Silicon AFM Tips from NanoWorld

Super Sharp Silicon AFM Tips from NanoWorld

NanoWorld Pointprobe® NCH probes are designed for non-contact or tapping™ mode imaging. This probe type combines high operation stability with outstanding sensitivity and fast scanning ability.

All probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The tip is shaped like a polygon based pyramid with a height of 10 -15 µm.

For enhanced resolution of nanostructures and microroughness we have developed an advanced tip manufacturing process leading to unrivalled sharpness of the SuperSharpSilicon tip.

This probe offers unique features:

  • Typical tip radius of curvature of 2 nm
  • Guaranteed tip radius of curvature 5 nm (yield >80%)
  • Half cone angle < 10° at the last 200 nm of the tip
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