WITec, a manufacturer of high-resolution Optical and Scanning Probe Microscopy
solutions, has introduced the WITec Project Plus software package for advanced
data evaluation and chemometric image processing. It features various tools
for multivariate data analysis in the fields of Confocal Raman Imaging and Scanning
Probe Microscopy such as cluster analysis and principal component analysis.
Thus, hidden structures in the images can be visualized automatically, leading
to quick and consistent interpretation of the data. Additionally, a variety
of advanced patent-pending analysis tools and algorithms enable comprehensive
and userfriendly computerized data evaluation and image generation.
The speed with which the extensive calculations behind the various algorithms
and procedures can be executed is unprecedented and provides a new level of
capability in analysis operations. WITec Project Plus can be obtained as an
add-on software package for the WITec Project data evaluation software.
For more information please go to http://www.lot-oriel.com/site/site_down/witec_projectplus_uk01.pdf
or call Shayz Ikram on 01372 378822, e-mail email@example.com