LayTec is proud to report
that its EpiTT system is successfully applied at Kopin Corporation (MA, US)
on AIXTRON 2600/IC system for temperature and reflectance monitoring of Heterojunction
Bipolar Transistor (HBT) epi wafer production.
the CS Mantech in May, Eric Rehder from Kopin presented the
measurement results and emphasized the following:
"...it is highly desirable to directly measure key epi layer parameters
on each product wafer in order to continue pushing
toward the goals of perfect quality and yields. Therefore,
we have been working with the LayTec EpiTT in-situ
optical reflectance monitoring system. These data allow
for immediate detection of shifts in the epi layers. Therefore, problems can
be detected and corrective actions taken
before failed wafers are grown."
The figure (top) shows how accurately the oscillations are measured and fitted
by EpiTT. It provides information on the run-to-run or wafer-to-wafer temperature
variations in real time making visible the changes that cannot be detected by
traditional metrology. The period of the oscillation yields the growth rate,
the "change" amplitude - the refractive index change; the damping indicates
the absorption of the film. The red line is the LayTec fit that nearly perfectly
overlays the experimental data of the blue line.
The example in the figure (bottom) demonstrates how the "change" amplitude
indicates a source doping problem during the base layer deposition. The reflectance
change amplitude during the base layer deposition is plotted for several runs.
The points show the depth of the oscillations for each run. The depth is normally
near 0.016, corresponding to a certain doping level of the base layer, but for
several runs it became shallower (0.013 - the points in the red circle). During
this time there was a source problem causing the doping to decreas, and after
fixing the problem the reflectance turned back to normal values.
In this way time reflectance measurements are used for insitu
doping level reproducibility control. For further information
please see the paper*.
*E. M. Rehder et. al. In Situ Monitoring of HBT Epi Wafer Production:
The Continuing Push Towards Perfect Quality and Yields. Published