At CONTROL 2010 to be held in Stuttgart from May 4-7, 2010, Carl
Zeiss will introduce its new and proven system solutions for materials research,
quality inspection and routine applications.
The Carl Zeiss Industrial Metrology Group will present high precision measuring
systems. The visitors to the exhibition expect tailor-made process solutions,
e.g. for suppliers and manufacturers in the auto industry. Further new hardware
and software products enable considerable improvements in measuring performance.
You can find details about the innovations of this business group at www.zeiss.de/imt.
The Microscopy Group will show solutions for the examination of large samples,
such as solar cells, wafers or flat panel displays, using contrasting techniques.
New products will also be presented for use in metallography, inspection tasks
in production and for polarization microscopy. New LED-based accessories are
available for stereomicroscopes.
For cross-system microscopy, a platform for correlative microscopy in materials
analysis will be presented that creates a link between a light and a scanning
You can find detailed information about the microscope systems and solutions