Site Sponsors
  • Strem Chemicals - Nanomaterials for R&D
  • Park Systems - Manufacturer of a complete range of AFM solutions
  • Oxford Instruments Nanoanalysis - X-Max Large Area Analytical EDS SDD

PARC, ASU Center Develop Flexible X-Ray Detector Using Advanced Thin Film Transistors

Published on March 19, 2013 at 5:04 AM

The Flexible Electronics and Display Center at Arizona State University (formerly the Flexible Display Center) and PARC, a Xerox company, announced that they successfully manufactured the world's largest flexible X-ray detector prototype using advanced thin film transistors.

Measuring 7.9 diagonal inches, the device was jointly developed at the center and PARC in conjunction with the Army Research Lab and the Defense Threat Reduction Agency. This device will be used to advance the development of flexible X-ray detectors for use in thin, lightweight, conformable and highly rugged devices.

The thin film transistors and PIN diode processing was done on the 470mm by 370 mm Gen II line at the Flexible Electronics and Display Center. This device showcases the center's successful scale up to GEN II, and the ability to produce sensors and displays using thin film transistors in standard process flows with the center's proprietary bond/de-bond technology.

The system design and integration was done at PARC. The flexible X-ray sensor was coupled to a flexible electrophoretic display and electronics to provide a self-contained, direct-view unit (including battery, user-interface and software). This system shows PARC's capability to build user-defined prototype systems incorporating novel device physics, materials and technology. PARC has extensive experience in building large-area electronic systems, display and backplane prototypes, and organic and printed electronics.

Source: http://www.asu.edu

Tell Us What You Think

Do you have a review, update or anything you would like to add to this news story?

Leave your feedback
Submit