Asylum Research Announce Webinar on AFM Nanomechanics

Published on June 4, 2013 at 4:59 AM

Asylum Research, an Oxford Instruments company, will host a new webinar on June 26, 2013, “Contact Resonance Tools for AFM Nanomechanics”.  Dr. Donna Hurley, Project Leader at the National Institute of Standards and Technology (NIST) and Asylum Research President and co-founder, Dr. Roger Proksch, will be presenting and taking questions.

The webinar is focused on materials scientists looking to probe nanomechanical properties and measuring moduli in the 1 to 200 GPa range for materials such as composites, thin films, biomaterials and polymer blends.

Modulus map of plant cell walls acquired on Asylum Research Cypher™ AFM. Sample provided by Dr. Bryon Donohoe (NREL). Image courtesy of Dr. Jason Killgore (NIST).

“Nanoscale information on mechanical properties is critical for many advanced materials and nanotechnology applications,“ commented Hurley. “While there are a large number of techniques for more compliant samples, few techniques are capable of measuring moduli in the 1 to 200 GPa range. Contact resonance is an excellent technique for sensitive, quantitative measurements for these materials. This webinar will be an excellent education for researchers wanting to learn more about the technique.”

The webinar will cover the basic concepts of contact resonance measurements with different approaches including point spectroscopy, qualitative contrast imaging, and quantitative mapping.  Discussion will also include practical implementation of contact resonance to a variety of samples and some of the pitfalls and artifacts that may be encountered. Finally, results will be presented on how CR methods have been used to improve the understanding of systems such as composites, thin films, biomaterials, and polymer blends.

About Asylum Research, an Oxford Instruments company

Asylum Research is the technology leader in atomic force microscopy for both materials and bioscience applications, dedicated to innovative instrumentation for nanoscience and nanotechnology. Founded in 1999, Asylum Research has over 300 years combined AFM/SPM experience among our staff. Asylum Research AFMs are used for a variety of nanoscience applications in material science, physics, polymers, chemistry, biomaterials, and bioscience, including single molecule mechanical experiments on DNA, protein unfolding and polymer elasticity, as well as force measurements for biomaterials, chemical sensing, polymers, colloidal forces, adhesion, and more.

Asylum’s MFP-3D™ family of AFMs sets the standard for AFM technology, with unprecedented precision and flexibility. Four configurations now comprise the MFP-3D family. The MFP-3D Origin, the most affordable member, offers performance and full upgrade potential. The full MFP-3D provides performance with the maximum versatility of a wide range of modes and accessories. The MFP-3D-BIO™ is the only full capability AFM integrated with commercial inverted optical microscopes for advanced bioscience research. In addition, our MFP NanoIndenter™ offers the only true instrumented indenting for quantitative measurements.

The Cypher™ AFM is the highest resolution fast scanning AFM, now with environmental control.  Cypher provides low-drift closed loop atomic resolution for the most accurate images and measurements possible today, point defect atomic resolution, >20X faster AC imaging with small cantilevers, Spot-On™ automated laser and photodetector alignment for easy setup, integrated thermal, acoustic and vibration control, and broad support for all major AFM/SPM scanning modes and capabilities.

Asylum Research offers the best warranties in the industry, ranging from two to five years, along with unmatched customer support. Asylum has global sales and service offices in Germany, UK, Japan, Shanghai and Taiwan.

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