Posted in | Nanoelectronics

Berkeley Design Automation’s AFS AMS Selected by IOsemi for RF Front-End Mixed-Signal Design Verification

Published on November 13, 2013 at 4:08 AM

Berkeley Design Automation, Inc., provider of the world’s fastest nanometer circuit verification, today announced that IO Semiconductor Inc. (IOsemi), a fabless semiconductor company developing high-performance RF front-end devices for multi-band, multi-mode cellular applications, has selected the company’s Analog FastSPICE™ AMS (AFS AMS) for RF front-end mixed-signal design verification.

“We require full-circuit mixed-signal simulation of our cellular front-end devices as part of our pre-tapeout verification flow,” said Stuart Molin, CTO at IOsemi. "With AFS AMS we are able to run nanometer-accurate mixed-signal verification of our CMOS RF front-end devices up to 7x faster than our existing mixed-signal simulator. In addition, AFS AMS is very easy to setup and use –enabling a big increase in our designers’ productivity.”

The Analog FastSPICE Platform provides the world’s fastest circuit verification for nanometer analog, RF, mixed-signal, memory, and custom digital circuits. Foundry certified to 20nm, the AFS Platform delivers nanometer SPICE accuracy 5x-10x faster than traditional SPICE and 2x-6x faster than parallel SPICE simulators. For large circuits the AFS Platform delivers >10M-element capacity and the fastest mixed-signal simulation. For memory and other array-based circuits, AFS Mega™ delivers silicon-accurate simulation with >100M element capacity. For silicon-accurate characterization it includes the industry’s only comprehensive full-spectrum device noise analysis and a high-productivity Analog Characterization Environment (ACE™)—both of which deliver 5x-10x speedup over alternative approaches. Available licenses for the AFS Platform include AFS Circuit Simulator, AFS Mega, AFS Nano, AFS Transient Noise Analysis, AFS RF Analyses, AFS Co-Simulation, AFS AMS, and ACE.

“We are excited that IOsemi selected AFS AMS for their mixed-signal verification flow for advanced digitally-controlled RF front-end circuits," said Ravi Subramanian, president and CEO of Berkeley Design Automation. "Achieving best-in-class cellular front-end performance in an RF-CMOS platform is a tremendous challenge. IOsemi’s selection of AFS AMS reinforces the tremendous value the AFS Platform offers in the design and verification of advanced RF-CMOS architectures for mobile phones.”

Source: http://www.berkeley-da.com/

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