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NanoSensors Release new Range of Silicon Probes for Magnetic Force Microscopy MFM

Published on February 22, 2007 at 10:10 AM

NANOSENSORS™ has launched a new series of silicon probes for Magnetic Force Microscopy (MFM) today.

For visualisation of magnetic domains by scanning probe microscopy different magnetic force microscopy probes are necessary.

NANOSENSORS™ Silicon MFM Probes are based on the well-known PointProbe® Plus AFM probe. The probes are optimized in view of high sensitivity and enable Tapping Mode, Non-contact and lift mode operation in air. They are designed to match the demands of a wide range of applications defined by the variety of magnetic samples with different properties. All the different magnetic coatings of the probes show an excellent long-term stability.

The NANOSENSORS™ Silicon MFM Probe Series offers six different types of MFM Probes.

The standard probes for Magnetic Force Microscopy feature a hard magnetic coating for high magnetic contrast and high lateral resolution.

The low momentum Magnetic Force Microscopy probes are designed for reduced disturbance of the magnetic sample by the tip and for enhanced lateral resolution. The newly introduced low coercivity Magnetic Force Microscopy probes are coated with a soft magnetic thin film enabling the measurement of magnetic domains within soft magnetic samples. Due to the low coercivity of the tip coating the magnetisation of the tip will easily get reoriented by hard magnetic samples.

For high resolution magnetic imaging the well-known NANOSENSORS™ SuperSharpSilicon™ tip is used as a basis and is combined with a very thin hard magnetic coating. This results in an extremely small tip radius and a high aspect ratio on the last few hundred nanometers of the tip apex – the essential requirements for high lateral resolution down to 20 nm in ambient conditions.

Additionally two types of Magnetic Force Microscopy that are dedicated for the use in ultra high vacuum have been developed.

A special version of the high resolution magnetic force microscopy probe was especially tailored for applications in UHV combining high resolution with a typical Q-factor of over 35 000 under UHV conditions.

The second special MFM probe for UHV is a low coercivity magnetic force probe that enables the measurement of magnetic domains within soft magnetic samples and also features a typical Q-factor of over 35 000 under UHV conditions.

With this new product introduction NANOSENSORS™ is now able to supply its customers with all basic probes needed for the various types of Magnetic Force Microscopy. Customized solutions for special needs are available upon request.

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