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Results 1 - 10 of 22 for Atomic Surface Profiler
  • Bruker Nano Surfaces and Metrology
    Supplier Profile
    Bruker Nano Surfaces and Metrology provides high-performance, specialized analysis and testing technology for the widest range of research and production applications. Our broad portfolio of 2D and...
  • KLA Instruments™
    Supplier Profile
    KLA Instruments encompasses a broad portfolio of surface metrology and defect inspection solutions within the KLA Corporation. KLA Instruments is divided into the Labs group of primarily benchtop...
  • Minus K Technology
    Supplier Profile
    Minus K® Technology, Inc. was founded in 1993 to develop, manufacture and market our state-of-the-art vibration isolation products based on our patented negative-stiffness-mechanism technology....
  • Icon Analytical Equipment
    Supplier Profile
    Icon Analytical Equipment is an established company in the field of analytical instruments, with a focus on nanotechnology and related analytical techniques. Headquartered in Mumbai, it has...
  • Image Metrology A/S
    Supplier Profile
    Image Metrology was founded in 1998. Today we are a world wide leading supplier of image processing software for "nano-microscopy". Our mission is to provide our customers with...
  • Design, Components and Operation of an Atomic Force Microscope
    Article - 17 Feb 2006
    This article serves as a basic introduction to the design and operation of an atomic force microscope. It covers basic concepts and technologies that help understand the construction and operation of...
  • Researchers Study Role of Temperature in Controlling in Dip-Pen Nanolithography
    News - 9 Nov 2011
    Scientists at the Lawrence Berkeley National Laboratory (Berkeley Lab) of the U.S. Department of Energy (DOE) have studied the function of temperature in manipulating a nanofabrication technique known...
  • Veeco Receives $1.7 Million Order from California NanoSystems Institute
    News - 8 Feb 2007
    Veeco Instruments announced that The California NanoSystems Institute (CNSI) at The University of California, Los Angeles (UCLA) has purchased $1.7 million of atomic force and scanning probe...
  • California Nanosystems Institute Purchase $1.7m AFM/SPM System from Veeco
    News - 7 Feb 2007
    Veeco Instruments Inc., announced that The California NanoSystems Institute (CNSI) at The University of California, Los Angeles (UCLA) has purchased $1.7 million of atomic force and scanning probe...
  • Nanoscience Instruments Announce New AFM with High Definition Electrical Measurement Capabilities
    News - 9 Apr 2015
    Nanoscience Instruments is pleased to offer the new Nano-Observer atomic force microscope (AFM). The Nano-Observer, designed by Concept Scientific Instruments, is ideal for current and future AFM...

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