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Results 11 - 20 of 59 for Atomic force microscopes
  • Dimension Edge Atomic Force Microscope (AFM) from Bruker
    Equipment
    The Dimension® Edge™ Atomic Force Microscope (AFM) System offers access to the highest performance, accessibility and functionality in its class, by incorporating Bruker's PeakForce Tapping®...
  • AIST-NT SmartSPM 1000 Atomic Force Microscope
    Equipment
    The 100% automated SmartSPM system from AIST-NT offers its cutting-edge technology of ultra-fast, metrological and high resolution measurements for the most advanced materials research at the nano...
  • The DME CompactGranite AFM System
    Equipment
    The DME CompactGranite is a granite sample stage for SPM. With a modular design that lends itself well to upgrades and additions, the stage enables strong AFM performance whilst maintaining...
  • ProberStation 200—A Large Sample AFM System
    Equipment
    Semilab’s ProberStation 200 large sample SPM stage allows for the automation of AFM measurements while maintaining efficiency and cost-effectiveness. The modular design allows for other important...
  • Rapid Scanning AFM with Super-Resolution Compatibility
    Equipment
    The NanoWizard 4 XP Bioscience combines atomic resolution with super-fast scanning and integration with most super-resolution microscopy platforms.
  • NanoWizard V NanoScience
    Equipment
    This product profile highlights the NanoWizard V NanoScience from Bruker JPK.
  • Cypher L: Entry Level Cypher AFM
    Equipment
    The Cypher L atomic force microscope from Oxford Instruments Asylum Research sets new expectations for performance and ease-of-use for AFMs in its price range.
  • DriveAFM: Flagship AFM Platform
    Equipment
    The DriveAFM is Nanosurf’s novel flagship AFM platform.
  • Applying AFM to Electrical and Mechanical Measurements
    Equipment
    Written for materials scientists, this profile introduces the world's most versatile atomic force microscope (AFM) for electrical and mechanical measurements.
  • Jupiter: High Performance Large Stage AFM
    Equipment
    The Asylum Research Jupiter XR Atomic Force Microscope from Oxford Instruments is the first and only large-sample AFM to offer both high-speed imaging and extended range in a single scanner.

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