The 100% automated
SmartSPM system that offers its cutting-edge technology of ultra-fast,
metrological and high resolution measurements for the most advanced materials
research at the nano scale in all AFM and STM modes.
Automation
With the SmartSPM the automated click-on-a-button laser-to-tip
alignment sets researchers free from this routine operation.
This feature also provides a high level of system adjustment
reproducibility that doesn’t depend on operator’s experience.
But this is just the beginning of all the automation built-in into the
SmartSPM!
In the automatic mode the operator should only specify the main
probe parameters and required scan area to let the SmartSPM perform the full system adjustment, engage the probe with the
sample surface and start scanning. The minimal learning period as
well as the very quick start of measurements (less than 5 minutes!)
makes the SmartSPM a perfect solution for any multi-user facilities.
Test your cantilever before running
measurements
Only with the SmartSPM it’s become possible to test cantilever’s
reflective backside coating before starting any measurements by
mapping the distribution of cantilever’s oscillation amplitude. In
addition, after the mapping is done, the operator can manually
choose the most appropriate position of the laser spot on the
cantilever based on his specific measurement requirements.
Quickly find the right place on your
sample
The combination of the motorized sample positioning in the horizontal
plane and the high resolution top-view optics allows researchers
to easily find the surface area where the further scanning is to be
done. This combination is also powered by the calibrated software video grabbing, so the user can identify interesting locations on
the sample surface and move the cantilever there by clicking on
the video image on the computer screen. During this process there are
no irritating blinking lights. The optical image remains absolutely
clear, because the AFM laser is 1300 nm IR.
Break the software limits
For advanced users both the embedded scripting language (Lua) and
DSP programming macro language are available. They allow the user to
easily personalize and automate their SPM experience by extending
the SmartSPM software with custom program extensions in
such categories as scanning, force curves, nanolithography, high throughput
screening (HTS) and more.
Resolution. Stability. Accuracy
Due to the combination of the low-noise registration system, unique
scanner, advanced electronics and smart scanning procedures that
incorporate over 100 years of combined SPM research experience,
with AIST-NT’s SmartSPM users can perform unique measurements
which are extremely difficult, if possible at all, for other SPM
instruments.
The extra-safe and at the same time fast tip-sample engagement
procedure makes it possible to protect even very sharp fragile tips
from any possible damage. Due to the availability of the true non-contact
scanning mode one can measure even the most delicate
and mechanically sensitive samples. The unique smart scanning
procedures allow the user to obtain high quality images on very
challenging objects like 120 nm Ag nanoparticles, DNA or polymer
lamellar structures.
Due to the very well designed and calculated construction of the AFM
and the scanner, only AIST-NT’s instrument features such outstanding
mechanical stability, which allows the user to get atomic resolution
images with the same 100 micron scanner and at the same time to produce high quality images without any vibration isolation tables.
This is of extreme importance for the integration of the AFM with the
optical facilities on top of an optical table.