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Scanning Probe Microscopy (SPM) Analysis of CD or DVD Discs and Stampers by NT-MDT

Compact Discs (CD) and Digital Versatile Discs (DVD) are popular data storage now. The information unit of CD/DVD is so called pit. Properties of the stamper that make the pit and the pit itself are...

http://www.azonano.com/article.aspx?ArticleID=1542 | 4 May 2006
Measurement of Cadmium Selenide ( CdSe ) Nanocrystals and Cluster Molecules Using Dynamic Light Scattering

This case study compares dynamic light scattering to other methods such as transmission electron microscopy and x-ray diffraction for the determination of particle size for Cadmium Selenide...

http://www.azonano.com/article.aspx?ArticleID=1098 | 20 Jan 2005
Magnetic Stray Field Measurement For The Determination Of Bits In A Hard Disk Using Magnetic Force Microscopy Imaging With The Nanosurf Mobile S And Easyscan 2

The Nanosurf Mobile S and EasyScan 2 (with mode extension) can image the magnetic stray field in the MFM (Magnetic Force Microscopy) imaging mode.

http://www.azonano.com/article.aspx?ArticleID=1770 | 26 Oct 2006
Electronics, Communications and Informatics - Markets, Technical Challenges and Global Competition

The nanoelectronics sector is expected to be one of the most lucrative areas of the nanotechnology marketplace. Current and future markets, nanotechnology methods with industry potential, technical...

http://www.azonano.com/article.aspx?ArticleID=1324 | 25 Jul 2005
Patenting in the Field of Nanotechnology by Elkington and Fife Patent and Trademark Attorneys

Information is provided for those who are interested in patenting a nanotechnology invention. Advice regarding intellectual property matters is provided and case study examples are given to assist you...

http://www.azonano.com/article.aspx?ArticleID=1055 | 25 Oct 2004
First Three Dimensional Assembly of Magnetic and Semiconducting Nanoparticles - New Technology

Scientists from Columbia University, IBM and the University of New Orleans have assembled a new, three-dimensional designer material from two different types of material. Posted June 25 2003

http://www.azonano.com/article.aspx?ArticleID=70 | 5 Nov 2003
High Throughput-High Resolution Sidewall Imaging Using 3D AFM

The AFM has been and still is a powerful tool in basic research and metrology. Height measurement by AFM is crucial in metrology, which however would also benefit from the capability to perform...

http://www.azonano.com/article.aspx?ArticleID=2995 | 26 Mar 2012
Nanostructured Aluminium Doped Zinc Oxide (AZO) Sputter Targets – Properties and Applications

AZO is a highly pure nanostructured aluminium doped zinc oxide with typical aluminium content between 0.5 to 2 wt%. Innovnano also offers custom combinations. AZO sputter targets are used to produce...

http://www.azonano.com/article.aspx?ArticleID=2972 | 10 Feb 2012
Nanophotonics Applications With Fluorescence Instruments From HORIBA Scientific

This article describes some applications of fluorescence instruments from HORIBA Scientific to nanophotonics, e.g., singlewalled carbon nanotubes (SWNTs), quantum dots, and organic light-emitting...

http://www.azonano.com/article.aspx?ArticleID=1624 | 6 Jul 2006
Scanning Probe and Atomic Force Microscopy: Technology Overview and Update

Scanning probe microscopes (SPMs) are instruments that measure properties of surfaces. They include atomic force microscopes (AFMs) and scanning tunnelling microscopes (STMs). SPMs are the most...

http://www.azonano.com/article.aspx?ArticleID=1527 | 8 Mar 2006

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