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Using Ion Conductance Microscope (ICM) to Image Collagen Fibrils

Ion conductance microscopy (ICM) is extensively used to obtain contact-free images of cell surface topography and to image cultured cells under liquid conditions. Here the new approach-retract...

http://www.azonano.com/article.aspx?ArticleID=2992 | 13 Mar 2012
True Topography AFM Scanning Using A Low Noise Z-Position Sensor

Atomic force microscopes (AFMs) use a piezoelectric crystal to actuate the positioning scanner. Creep and hysteresis errors however limit the capability of measuring the sample topography. This...

http://www.azonano.com/article.aspx?ArticleID=2990 | 13 Mar 2012
End Point Detection in Ion Beam Etching using SIMS Quadrupole Mass Spectrometry by Hiden Analytical

The use of SIMS Quadrupole Mass Spectrometry for End Point Detection during ion beam etch is demonstrated. This article describes the principle behind the technique and provides examples from the...

http://www.azonano.com/article.aspx?ArticleID=2699 | 17 Sep 2010
Hiden SIMS Workstation - A Cost Effective Secondary Ion Mass Spectrometry (SIMS) Solution by Hiden Analytical

Secondary ion mass spectrometry is the most sensitive of the generally available surface analysis techniques. It is able to measure low level concentrations down to parts per billion, provide imaging...

http://www.azonano.com/article.aspx?ArticleID=2697 | 17 Sep 2010
Depth Profile of Hard Drive Platter using Sputtered Neutral Mass Spectrometry by Hiden Analytical

Sputtered Neutral Mass Spectrometry is ideally suited to the analysis of thin films where composition, thickness and interface condition can be determined. In this example a hard drive platter is...

http://www.azonano.com/article.aspx?ArticleID=2696 | 17 Sep 2010
Composition and Failure Analysis of Low-Emissivity Glass using Secondary Ion Mass Spectrometry (SIMS) by Hiden Analytical

The requirement for energy efficient buildings has led to the development of glass coatings capable of reflecting heat (infrared radiation) whilst passing visible light with little degradation of...

http://www.azonano.com/article.aspx?ArticleID=2692 | 17 Sep 2010
Imaging of Semiconductor Contact Pads using Secondary Ion Mass Spectrometry (SIMS) by Hiden Analytical

The surface chemistry of integrated circuit bond pads is crucial to correct connection welding. SIMS imaging provides a rapid method of assessing surface chemistry and identifying pads covered by even...

http://www.azonano.com/article.aspx?ArticleID=2691 | 17 Sep 2010
Investigating the Properties of Optical Interconnects Using Scanning Nearfield Optical Microscopy by WITec

With the alpha300 S from WITec used in the PSTM mode, it is possible to image SPP propagation directly in plasmonic structures and devices of more complex architecture to determine their behavior.

http://www.azonano.com/article.aspx?ArticleID=2087 | 19 Mar 2008
Research Group Focuses on Fabrication and Characterization of Nanoelectronic and Optical Devices - Customer Profile by WITec

The research of the Nanoscale Electronics and Photonics Group of Prof. Brongersma at Stanford University is focused on the fabrication and characterization of nanometer-sized electronic and optical...

http://www.azonano.com/article.aspx?ArticleID=2031 | 7 Nov 2007
Characterization and Analysis of Nanomaterials Using the NanoLog Spectrofluorometer by Horiba Scientific

Spectrofluorometers can be used to measure the properties and structure of nanomaterials such as single-walled carbon nanotubes (SWCNs) and quantum dots. Fluorescence, processing methods,...

http://www.azonano.com/article.aspx?ArticleID=1361 | 17 Aug 2005

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