Home
Home
Articles
News
Directory
Equipment
Experts
Classifieds
Books
News
Atomic Force Microscopes
Bionanotechnology
Carbon Nanotubes
Control Systems
Data Loggers
Dendrimers
Fullerenes
Graphene
Lab on a Chip
MEMS - NEMS
Microscopy
Nanoanalysis
Nanobusiness
Nanoelectronics
Nanoenergy
Nanoethics
Nanofabrication
Nanofluidics
Nanoindentation
Nanolithography
Nanomagnetics
Nanomaterials
Nanomedicine
Nanooptics and Nanophotonics
Nanoregulations
Nanosensors
Nanotoxicology
Quantum Dots
Articles
Latest Articles
Thought Leaders
Commercializing Nanotechnology
AZojono - Journal of Nanotechnology
Global Market Reports
Materials
Suppliers A to Z
Applications
Industries
Equipment
Aerosol Coating Equipment
AFM Tips, Probes, Cantilevers
Atom Probes
Atomic Emission Spectrometers
Atomic Force Microscopes (AFM)
Atomic Layer Deposition (ALD) Systems
Biomedical Atomic Force Microscopes (bio-AFM)
Calorimeters
Carrier Concentration Profiler
Control Systems
Cryogenic Probe Stations
Data Loggers
Dynamic Light Scattering Instruments
Electrical Conductivity Measurement Systems
Electron Backscattered Diffraction (EBSD) Systems
Ellipsometers
Energy Dispersive X-Ray Spectroscopy (EDS)
Flow Chemistry Reactors
Focused Ion Beam (FIB) Accessories
Focused Ion Beam (FIB) Systems
FT-IR and FT-NIR Spectrometers
Helium Ion Beam Microscopes (HIM)
Induction Heating
Micro Hardness Testers
Microfluidic Devices
Micropositioning Systems
Mills for Reducing Particle Size
Moisture Analyzers
Nanofiber Production Equipment
Nanoimprint Lithography Equipment
Nanoimprint Lithography Templates
Nanoindentation Testers
Nanolithography Systems
Nanoparticle Characterization Systems
Nanoparticle Production Systems
Nanopositioning Systems
Optical Characterization Systems
Optical Tweezers
Particle Size Analyzers
Photoluminescence Mapper
Piezo Actuators
Plasma Cleaning Systems
Plasma Etching Systems
Profilometers
Raman Spectrometers
Sample Preparation Equipment
Scanning Electron Microscope (SEM) Accessories
Scanning Electron Microscopes (SEM)
Scanning Near-Field Optical Microscopes (SNOM)
Scanning Probe Microscopes (SPM)
Scratch Testers
Separation Membranes
Spectrofluorometers
Spectrometers
Spectrophotometers
Spectroscopic Ellipsometers
Sputtering Systems
Streak Cameras
Surface Area Analyzers
TEM Sample Holders and Supplies
Thermal Analysis Equipment
Thermal Desorption Equipment
Thin Film and Coating Thickness Measurement Tools
Thin-Film Deposition Systems
Time Delay Inegration (TDI) Cameras
Transmission Electron Microscopes
Tribometers - Friction and Wear Testers
Ultrasonic Processing Equipment
Vibration Isolation Systems
Wafer Bonders
X-Ray Cameras
X-Ray Diffractometers
X-Ray Fluorescence Analyzers
Zeta Potential Analyzers
Classifieds
Books
Bionanotechnology
Carbon Nanotubes
Dendrimers
Fullerenes
MEMS - NEMS
Microscopy
Nanodevices
Nanoelectronics
Nanoenergy
Nanolithography
Nanomaterials
Nanomedicine
Nanotechnology
Nanotoxicology
Quantum Dots
Journals
Nanoelectronics
Nanoethics
Nanofabrication and Processing Technologies
Nanofluidics
Nanomagnetics
Nanomaterials
Nanomedicine
Nanooptics
Nanosensors
Nanotechnology
Quantum Physics
Spectroscopy
Videos
Atomic Force Microscopes
Graphene
ICONN 2010 Interviews
Lab on a Chip
Microfluidics - Devices and Systems
MRS 2008 Fall Meeting Video Interviews
MRS 2010 Fall Meeting Video Interviews
MRS 2011 Fall Meeting Video Interviews
MRS 2012 Fall Meeting Video Interviews
Nanoanalysis
NanoArt
Nanomanipulation
Nanomaterials
Nanooptics and Nanophotonics
Nanosensors
Nanotechnology and the Environment
Nanotechnology Applications
Nanotechnology in Aerospace
Nanotechnology in Energy
Nanotechnology in Medicine
Nanotechnology in Semiconductors
Nanotechnology Overviews
Nanotubes
Pittcon 2009 Video Interviews
Pittcon 2012 Interviews
Self Assembly
X-Ray Diffraction
Courses
Courses
Events
About
Contact
Meet the Team
Help/FAQs
Terms
Search
Advertise
May 24, 2013
Browse by:
Materials
|
Applications
|
Industries
About
Advertise
Terms
Site Sponsors
Latest Nano News
United Microelectronics Sets up Center of Excellence for Specialty Technologies at Singapore
Axcelis Delivers Novel Purion Platform for Sub-16 nm Devices to Asian Semiconductor Manufacturer
Nucleation of Ice Substantially Suppressed in Nano-Sized Water Droplets
Graphene-Covered Silver Nanowire Electrodes Hold Promise for Touch-Screen Monitors
Spin Orientation Controlled in Magnetic Nanodisks
Site Sponsors
Search
Request for Quote (RFQ): If you'd like us to help you source a Quotation for any particular products or from any suppliers, please
click here
. Once submitted, we will try and place you in contact with a suitable supplier within 48 hours.
Videos
Experts
Journals
Courses
Events
Classifieds
Search is Loading...
All
News
Articles
Suppliers
Equipment
Books
More
Results
1
-
10
of
24
for
TGA
.
Search
Next>
Thermal Gravimetric Analysis (TGA) - Techniques and Services Available from Particle Technology Labs
Thermal Gravimetric Analysis is a thermal analysis technique used to determine changes in mass as a function of temperature for polymers, pharmaceuticals, cosmetics and food.
http://www.azonano.com/article.aspx?ArticleID=2459
|
1 Dec 2009
New Nanoanalysis Method to Test Purity of Micro-Materials
A new chemical analysis technique developed by a research group at the National Institute of Standards and Technology (NIST) uses the shifting ultrasonic pitch of a small quartz crystal to test the...
http://www.azonano.com/news.aspx?newsID=20684
|
25 Nov 2010
Discovery TGA from TA Instruments
The Discovery TGA features our industry-leading thermobalance, innovative IR-heated furnace, patented Hi-Res TGA, and an autosampler unmatched in flexibility and reliability.
http://www.azonano.com/equipment-details.aspx?EquipID=604
TGA-HP High Pressure TGA- TA Instruments
Designed to address the most demanding applications, the TA Instruments TGA-HP50 instrument is a specialty gravimetric analyzer which provides unique capabilities for High-Pressure, Ultra-High Vacuum,...
http://www.azonano.com/equipment-details.aspx?EquipID=608
Netzsch TG 209 F1 Libra Thermal Analyzer
Based on over 50 years of experience in thermogravimetry, NETZSCH has developed the thermobalance TG 209 F1 Libra®. This instrument allows for analyses to be carried out even faster, more...
http://www.azonano.com/equipment-details.aspx?EquipID=300
The Synthesis of Bamboo Structured Carbon Nanotubes on MgO Supported Bimetallic Cu-Mo Catalysts
This article shows the successful synthesis of bamboo structured carbon nanotubes (BCNTs) using the catalytic decomposition of methane over supported Cu/Mo catalysts. Analysis of the BCNTs indicate...
http://www.azonano.com/article.aspx?ArticleID=2037
|
14 Nov 2007
HPR-20 QIC Bench Top Evolved Gas Analysis (EGA) System from Hiden Analytical
A compact bench top analysis system for evolved gas analysis from Hiden Analytical.
http://www.azonano.com/equipment-details.aspx?EquipID=546
Differential Scanning Calorimetry (DSC) and Thermal Gravimetric Analysis (TGA) - Thermal Analysis Services Available from Particle Technology Labs
Particle Technology Labs can provide thermal analysis services for you. These includes Differential Scanning Calorimetry (DSC) and Thermal Gravimetric Analysis (TGA). Applications of these thermal...
http://www.azonano.com/article.aspx?ArticleID=2460
|
1 Dec 2009
Eliminating Residual Oxygen During Thermal Analysis of Materials in Inert Atmospheres by Netzsch
The presence of residual oxygen is a well known problem in thermal analysis. When samples are investigated in inert gas atmospheres any residual oxygen is decisive in most cases because possible...
http://www.azonano.com/article.aspx?ArticleID=2441
|
3 Nov 2009
Iron Hydroxy Sulfate - Simultaneous Thermal Analysis Using the STA 449 F1 Jupiter® by Netzsch
Thermal analysis can yield valuable information on sample composition for a broad range of applications. This application note from NETZSCH demonstrates how simultaneous thermogravimetry and...
http://www.azonano.com/article.aspx?ArticleID=2437
|
2 Nov 2009
Result Page
1
2
3
Next