Curious about where Atomic Force Microscopy (AFM) is making the biggest impact right now? The new AFM Industry Focus eBook brings together some of the latest stories, insights, and real-world examples showing how AFM is being used across materials science, semiconductors, and life science research.
It covers everything from high-resolution surface mapping and roughness measurements to nanomanipulation and real-time imaging, plus, you’ll see how AFM is helping teams improve quality control, explore new materials, and push the limits of nanoscale research.
Whether you're working with semiconductors, thin films, biomaterials, or are involved in cutting-edge nanotech, there's something here for you.
We’ve included examples of hybrid systems that pair AFM with super-resolution optics, tools for measuring sidewall uniformity in production, and even biological use cases where understanding nanoscale mechanics is key.
Download your free copy of the eBook to see how AFM is helping researchers and engineers get the details they need to innovate with confidence.
Some of this information has been sourced, reviewed and adapted from materials provided by Bruker Nano Surfaces and Metrology.
For more information on this source, please visit Bruker Nano Surfaces and Metrology.