Posted in | Microscopy

Bruker's ContourGt-X8 Optical Surface Profiler Chosen to Characterize Alcon IOLs

Bruker announced today that Alcon Corporation has selected the Bruker ContourGT-X8 Optical Surface Profiler to provide non-destructive, non-contact reference metrology for critical dimensioning and 3D characterization of Alcon's current and next-generation intra-ocular lenses (IOLs).

Alcon is the global leader in eye care, offering the widest spectrum of eye care products across surgical, pharmaceutical and vision care.

The Bruker ContourGT®-X8 Optical Surface Profiler.

"The ContourGT-X8 is Bruker's flagship optical profiler, offering the most advanced capabilities in enhanced metrology hardware and parallel processing Vision64 software," said Robert M. Loiterman, Vice President and General Manager of Bruker's Stylus and Optical Metrology Business in Tucson, Arizona.

"We are confident that the many innovative enhancements on the ContourGT 3D microscope platform, such as the increased brightness dual HB-LED light source, lower noise-floor and industry leading 64-bit Vision64 software with parallel processing, will meet Alcon's demanding metrology requirements," commented Andrew Masters, Vice President of Strategic Marketing and Business Development of Bruker's Nano Surfaces Division.

About the ContourGT Family

Introduced in 2010, the ContourGT family of 3D microscopes features Bruker-patented, high-brightness dual-LED illumination that, when combined with the family's superior vertical resolution, greatly improves sensitivity and stability and enables precision non-contact 3D surface metrology in difficult applications and environments that are challenging for other systems. The ContourGT family also features the new Bruker-developed and patent-pending Vision64 operating and analysis software that includes parallel processing for enhanced throughput, optional AcuityXR capabilities for beyond optical-diffraction-limit profiling and the industry's most intuitive, modular user interface that provides user-level-customization capabilities for a wide range of surface profiling metrology applications. For more information, or to schedule a demo, please call +1 (520) 741-1044 ext. 3, email [email protected] or visit

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