Bruker today announced the launch of the new, scalable ContourGT-K 3D optical microscope for value-oriented, uncompromised bench-top metrology. Incorporating many of the advanced features of Bruker’s flagship optical metrology products, the ContourGT-K delivers unsurpassed Z-axis resolution across all fields of view and superior 2D/3D imaging capability for non-contact profile, roughness and thickness measurements on a wide range of surfaces.
The system’s gage-capable, streamlined design includes integrated air isolation for robust vibration tolerance in even challenging production environments. The new ContourGT-K also incorporates the latest version Bruker Vision64™ software and the most extensive library of pre-programmed filters and analyses for easy access to advanced measurements for LED, solar cell, thick films, semiconductor, ophthalmic, medical device, MEMS and tribology applications.
“Bruker has drawn on three decades of optical measurement experience and innovation to deliver a true metrology system at price points previously only attainable with traditional confocal imaging systems,” said Rob Loiterman, Executive Vice President and General Manager of Bruker’s Stylus and Optical Metrology Business. “With ContourGT-K, researchers and engineers no longer have to choose between great images and quantifiable metrology.”
“Cost-optimized for high speed, accuracy, and ease of use, the ContourGT-K delivers the precision required for demanding metrology over a very broad range of surfaces,” added Kent Heath, Senior Director of Bruker’s Stylus and Optical Metrology Business. “It features an extensive array of factory and field upgradeable add-ons, such as application-specific productivity software, automated turret, stages and tilt functions, color and high-resolution camera options, and our unique NanoLens™ AFM module, which together make the ContourGT-K highly scalable to meet evolving customer needs.”
About the ContourGT-K 3D Optical Microscope
The ContourGT-K is the latest addition to Bruker’s ContourGT® line of 3D optical microscopes. It sets a new industry standard in design and cost for surface metrology performance. With exceptional surface characterization and 2D/3D measurement as well as high-resolution imaging capabilities, this new system offers uncompromised metrology in a simplified, compact package. The ContourGT-K features patented, higher brightness dual-LED illumination and superior vertical resolution that greatly improves sensitivity and stability. Intuitive Vision64 software provides the industry’s easiest to use interface and most powerful measurement and analysis software. The system’s full complement of options brings both flexibility for additional application needs and continual advancement of metrology capabilities as needs and budgets increase.