Posted in | News

Bruker Launches New Dimension XR Family of Scanning Probe Microscopes

Bruker today announced the release of the Dimension XR™ family of scanning probe microscopes (SPMs). These new systems incorporate major AFM innovations, including Bruker’s proprietary and exclusive DataCube nanoelectrical modes, AFM-SECM for energy research, and the new AFM-nDMA mode, which for the first time correlates polymer nanomechanics to bulk dynamic mechanical analysis (DMA). Building on two of the world’s most utilized AFM platforms in scientific publications, the Icon® and FastScan®, Dimension XR SPMs are available in three configurations optimized for nanomechanics, nanoelectrical, and nanoelectrochemical applications. These systems significantly expand researchers’ ability to quantify material properties at the nanoscale in air, fluids, electrical, and chemically reactive environments.

“The new Dimension XR systems are the culmination of years of innovations to provide quantitative and easy-to-use nanomechanical, nanoelectrical, and nanoelectrochemical characterization,” explained David V. Rossi, Executive Vice President and General Manager of Bruker’s AFM business. “Our goal is to make these first and only capabilities widely available to the research community, enabling their breakthrough AFM discoveries with new nanoscale information.”

About Dimension XR SPMs

Bruker’s Dimension XR systems are available on either the Icon or FastScan AFM platforms, and feature three configurations that provide out-of-the-box characterization for breakthrough nanomechanics, nanoelectrical, and nanochemical research. The Dimension XR Nanomechanics configuration combines AFM-nDMA, PeakForce QNM, FASTForce Volume, and FASTForce Volume CR modes to rapidly and quantitatively characterize materials for their nanomechanical characteristics. The Dimension XR Nanoelectrical configuration includes PeakForce TUNA™, PeakForce KPFM™ and DataCube modes for the most complete array of electrical AFM techniques on a single system. The Dimension XR NanoEC configuration utilizes Bruker-unique nanoelectrode probes with EC-AFM and PeakForce SECM™ modes to perform in-situ topography scans in the electrochemical environment, providing a turnkey solution for real-time quantitative analysis of nanoscale local reactivity.

Citations

Please use one of the following formats to cite this article in your essay, paper or report:

  • APA

    Bruker Nano Surfaces and Metrology. (2019, March 19). Bruker Launches New Dimension XR Family of Scanning Probe Microscopes. AZoNano. Retrieved on May 25, 2024 from https://www.azonano.com/news.aspx?newsID=36445.

  • MLA

    Bruker Nano Surfaces and Metrology. "Bruker Launches New Dimension XR Family of Scanning Probe Microscopes". AZoNano. 25 May 2024. <https://www.azonano.com/news.aspx?newsID=36445>.

  • Chicago

    Bruker Nano Surfaces and Metrology. "Bruker Launches New Dimension XR Family of Scanning Probe Microscopes". AZoNano. https://www.azonano.com/news.aspx?newsID=36445. (accessed May 25, 2024).

  • Harvard

    Bruker Nano Surfaces and Metrology. 2019. Bruker Launches New Dimension XR Family of Scanning Probe Microscopes. AZoNano, viewed 25 May 2024, https://www.azonano.com/news.aspx?newsID=36445.

Tell Us What You Think

Do you have a review, update or anything you would like to add to this news story?

Leave your feedback
Your comment type
Submit

While we only use edited and approved content for Azthena answers, it may on occasions provide incorrect responses. Please confirm any data provided with the related suppliers or authors. We do not provide medical advice, if you search for medical information you must always consult a medical professional before acting on any information provided.

Your questions, but not your email details will be shared with OpenAI and retained for 30 days in accordance with their privacy principles.

Please do not ask questions that use sensitive or confidential information.

Read the full Terms & Conditions.