Advanced electronics - AZoNano Search

Design and Characterisation of an Ultra-Precision X-Y Stage – The NPS-XY-100A

Article - 8 Dec 2005

This paper describes the design of an ultra-precision xy positioning and scanning stage the Queensgate NPS-XY-100A. Special emphasis is placed on the design concept and metrological considerations....

Park NX20 300 mm AFM for Wafer Measurement and Analysis

Equipment

The Park NX20 300 mm is a large sample AFM that supports a fully motorized traveling range of 300 x 300 mm.

Novel Materials - Classification, Markets, Challenges in Manufacturing and Global Competition

Article - 28 Jun 2005

Applying nanotechnology methods in the area of materials can result in the creation of novel materials with new, unique and exciting properties. The classification and composition of nanomaterials,...

R9 SPM Control System for all SPM Modes and Techniques from RHK Technology

Equipment

The unique R9 from RHK Technology is constructed based on nearly 25 years of technological expertise in scanning probe microscopy.

Review of Current Concepts on Convergence of Nanotechnology With Biology

Article - 19 May 2005

Bionanotechnology is a result of the convergence of biotechnology and nanotechnology.

Ten Lessons for the Nanotech Entrepreneur from the Photonics Bubble

Article - 17 Feb 2005

Parallels are drawn between the photonics bubble and emerging technology areas such as nanotechnology. The mistakes and lessons learned after the photonics bubble and are discussed with relation to...

Nanotechnology Defined - What is Nanotechnology All About?

Article - 19 Mar 2004

Nanotechnology can be ideally defined as the ability to design new attributes by manipulating features at a very minute scale—at or around the scale of a nanometer.

Carbon Nanotubes and Spintronics - Properties and Applications

Article - 18 Mar 2004

Going beyond traditional electronics in the solid state, it is plausible to think that the next revolution in electronics would be molecular.

A Guide to Atomic Force Microscopy (AFM) and Transmission Electron Microscopy (TEM)

Article - 2 Mar 2004

This article discusses the similarities and differences between atomic force microscopy (AFM) And transmission electron microscopy (TEM).

A*STAR's SERC Awarded S$12.2m to Fund 17 Research Projects Including Nanotechnology

News - 10 Sep 2009

A*STAR's Science and Engineering Research Council (SERC) awarded S$12.2m to fund 17 research projects in the areas of media + entertainment, medical technologies, education, water, infocomm,...