Article - 25 Aug 2004
Nanoworld have introduced their new Hybid- Nitride probe for atomic force microscopy use in contact mode. Posted August 1 2004
Article - 13 May 2004
The atomic force microscope (AFM), together with the scanning tunneling microscope (STM), was invented in 1986 by Binnig, Quate, and Gerber.
Article - 16 Jan 2004
Molecular Imaging, Corp. today announces PicoMAPS, a Motorized Atomic Force Microscope (AFM) Precision Stage designed for surface characterization of large samples. Posted December 2 2003
Article - 1 Dec 2003
Rensselaer Polytechnic Institute has recognized its newly remodeled Rensselaer Nanotechnology Center (RNC). Posted September 15 2003
Article - 27 Nov 2003
How do you weigh a dust mite? Or determine the force required to pull a molecule apart? Such tasks require a device that measures nanonewtons - forces 1 billion times smaller than the force required...
Article - 25 Nov 2003
Nanoscientists hope to remake AFMs to more accurately create molecular scale structures
Article - 20 Nov 2003
Researchers have describes a new method for scanning semiconductors for defects that may help accelerate the market for these newer materials. Posted September 26 2003
Article - 13 Nov 2003
Applied NanoMaterials, Inc. has announced that it will manufacture a new kind of inorganic nanotube for products such as advanced generation high resolution flat panel displays and atomic force...
Article - 24 Aug 2006
Using Atomic Force Microscopy and Scanning Tunneling Microscopy (STM) for the control and manipulation of submicron systems.
Article - 21 Jul 2006
It is essential to have the tools that enable the maker to see, control, and engineer at the atomic level, before making anything.