Capacitors - AZoNano Search

Characterization of Novel Data Storage Solutions

Article - 24 Jun 2022

Explore the characterization of novel date solutions with AFM and EDS.

Piezoelectric Materials and Piezo Response Force Microscopy (PFM)

Article - 19 Jan 2022

Learn more about piezoelectric materials and piezo response force microscopy (PFM).

SEM, AFM, Correlative Microscopy and Heterostructure Analysis

Article - 1 Apr 2021

Semiconductors are made from heterostructures. SEM, AFM and correlative microscopy methods are all excellent for analyzing heterostructures.

Utilizing Sideband Kelvin Probe Force Microscopy for Surface Potential Imaging

Article - 12 Mar 2021

Kelvin Probe Force Microscopy has emerged as a powerful tool for the measurement of surface potential. Sideband KPFM in particular has very high resolution and is thus highly useful for analyzing...

Dual Frequency Resonance Tracking: Stabilizing the Piezoresponse

Article - 21 Jan 2021

In this article, Park Systems describes how piezoresponses can be imaged via Dual Frequency Resonance Tracking. This technique allows for accurate and noise-free ferroelectric domain characterization.

The Properties and Applications of Bimetallic Nanoparticles

Article - 10 Dec 2020

Bimetallic nanoparticles have recently generated a lot of interest in the scientific community. It is a relatively new scientific study area with a wide range of applications across various science...

Applications of Scanning Capacitance Microscopy (SCM)

Article - 12 Aug 2020

The invention of Scanning Capacitance Microscopy (SCM) allowed engineers to probe the devices at the sub-micron scale and identify issues both during device fabrication and for failure analysis.

Stabilizing the Piezoresponse for Ferroelectric Domain Characterization

Article - 4 Aug 2020

Dual-frequency resonance tracking can be used to stabilize the piezoresponse for accurate and crosstalk-free ferroelectric domain characterization.

Characterization of Vacuum Channel Nanoelectronic Devices

Article - 12 Nov 2018

This article discusses using scanning capacitance microscopy to characterize vacuum channel nanoelectrical devices.

The Role of Atomic Force Microscopy (AFM) in 3D Printing

Article - 11 Nov 2018

This article discusses 3D printing and the role of atomic force microscopy (AFM) within it.