AFM Imaging and Beyond: A Practical Guide to AFM Modes for Materials Research

Characterize much more than just nanoscale topographic features

Atomic force microscopy is an umbrella term comprising dozens of complementary “modes” of operation. These different modes can not only characterize nanoscale topographic features but also nanoelectrical, nanomechanical, and nanochemical properties of samples. In this webinar, we will look at the ever growing suite of AFM modes and highlight some of the most frequently used ones. We will cover case studies in hot topics, such as battery, semiconductor, and 2D materials, and demonstrate how the use of multiple AFM modes can provide a better understanding of materials at the nanoscale than one mode alone.

The presentation will include case studies in battery, semiconductor, and 2D materials research.

Webinar Speakers

Ian Armstrong
Sales Applications Manager-North America, Bruker

Ravi Chintala
Applications Scientist, Bruker

John Thornton
Engineer Sr. Applications, Bruker

Senli Guo
Sales Applications Engineer, Bruker

Peter Dewolf
WW Application Director, Bruker

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