Characterize much more than just nanoscale topographic features
Atomic force microscopy is an umbrella term comprising dozens of complementary “modes” of operation. These different modes can not only characterize nanoscale topographic features but also nanoelectrical, nanomechanical, and nanochemical properties of samples. In this webinar, we will look at the ever growing suite of AFM modes and highlight some of the most frequently used ones. We will cover case studies in hot topics, such as battery, semiconductor, and 2D materials, and demonstrate how the use of multiple AFM modes can provide a better understanding of materials at the nanoscale than one mode alone.
The presentation will include case studies in battery, semiconductor, and 2D materials research.
Sales Applications Manager-North America, Bruker
Applications Scientist, Bruker
Engineer Sr. Applications, Bruker
Sales Applications Engineer, Bruker
WW Application Director, Bruker