Keithley Instruments, Inc.
(NYSE: KEI), a world leader in advanced electrical test instruments and
systems, will broadcast a free, web-based seminar titled "Semiconductor
Capacitance-Voltage (C-V) Fundamentals," which will be presented by Electronic
Lee Stauffer, Senior Staff Technologist for Keithley’s Semiconductor
Measurements Group will present the webinar and take questions from the audience
at the end. The webinar will be broadcast on Tuesday, June 2, at 2:00 p.m. ET
(11:00 a.m. PT). This one-hour seminar is designed to introduce the topic of
C-V measurements as they relate to semiconductor device and materials characterization.
Click here to register for
C-V testing is commonly used to determine semiconductor parameters such as
doping profiles, density of interface states, threshold voltages, oxide charge,
and carrier lifetime. The Keithley webinar is targeted to engineers who are
new to semiconductor materials and device testing, process and device engineers
who would like to refresh their knowledge of this testing methodology, and characterization
lab managers. Those attending the seminar will learn what C-V testing is, the
types of devices C-V testing can be used to characterize, who can use it, and
the challenges associated with making C-V measurements.
Lee Stauffer is Senior Staff Technologist for Keithley Instruments’ Semiconductor
Measurements Group, based in Cleveland, Ohio. Prior to joining Keithley, his
career included designing satellite communication systems, as well as equipment
and product engineering in semiconductor fabs.
“Semiconductor Capacitance-Voltage (C-V) Fundamentals” will be
broadcast on Tuesday, June 2, at 2:00 p.m. ET (11:00 a.m. PT). The event is
free to the public, but participants must register at http://tiny.cc/Oj6Zm
in advance. The seminar will also be archived on Keithley’s website for
those unable to attend the original broadcast.