Inc. (NYSE: KEI), a world leader in advanced electrical test instruments
and systems from DC to RF (radio frequency). , has sponsored the premier issue
of Project TEST, in cooperation with Electronic Products magazine and the Hearst
Electronics Group. To read Project TEST, a unique 32-page electronic magazine
edited for test and measurement engineers, visit http://www.nxtbook.com/nxtbooks/hearst/projecttest_200904/index.php.
As the sponsor of the first issue, Keithley authors contributed a number of
articles, including “Fundamentals of Semiconductor C-V Measurements,”
“Design Considerations for Maximizing Throughput and Accuracy in Switch/Measure
Instrumentation,” “Trends in RF Testing,” and “Taking
the Measure of Pulse Generators.” Other features of the premier issue
include a viewpoint on “Real Innovation in Instrument Connectivity,”
and an article on “Solutions for Testing MEMS Devices at the Wafer Level”
from SUSS Microtech Test Systems.
Project TEST also provides access to a number of unique resources no print
magazine can reproduce, including video product presentations, an interactive
guide to digital multimeters, and an Electronic Products test and measurement