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Keithley Instruments Sponsores The Premier Issue Of Project TEST

Published on June 30, 2009 at 10:18 PM

Keithley Instruments, Inc. (NYSE: KEI), a world leader in advanced electrical test instruments and systems from DC to RF (radio frequency). , has sponsored the premier issue of Project TEST, in cooperation with Electronic Products magazine and the Hearst Electronics Group. To read Project TEST, a unique 32-page electronic magazine edited for test and measurement engineers, visit http://www.nxtbook.com/nxtbooks/hearst/projecttest_200904/index.php.

As the sponsor of the first issue, Keithley authors contributed a number of articles, including “Fundamentals of Semiconductor C-V Measurements,” “Design Considerations for Maximizing Throughput and Accuracy in Switch/Measure Instrumentation,” “Trends in RF Testing,” and “Taking the Measure of Pulse Generators.” Other features of the premier issue include a viewpoint on “Real Innovation in Instrument Connectivity,” and an article on “Solutions for Testing MEMS Devices at the Wafer Level” from SUSS Microtech Test Systems.

Project TEST also provides access to a number of unique resources no print magazine can reproduce, including video product presentations, an interactive guide to digital multimeters, and an Electronic Products test and measurement news feed.

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