Aehr Test Systems, a provider of semiconductor burn-in and test equipment, has supplied its 100th full-wafer contactor for application in its Fox line of equipment used in wafer level burn-in and wafer sort test applications.
Aehr Test Systems markets its full-wafer contactors in conjunction with its FOX-15 Wafer Level Burn-in System and FOX-1 Wafer Sort Tester to offer a complete solution for VCSEL devices, sensors, microcontrollers and flash memory.
Rhea Posedel, who serves as Aehr Test Systems’ Chairman and Chief Executive Officer, stated that this supply is a major landmark to the company, marking a significant contribution of the company’s full-wafer contactors to its business. The company considers that its full-wafer contactor technology is one-of-its-kind, as it is utilized for parallel analysis of wafers that require more number of dies in a single touchdown. The company contacted and concurrently tested certain wafers with 60,000 contacts and others with more than 10,000 dies.
Aehr Test Systems’ Vice President of Sales and Marketing, Carl Buck stated that though a majority of the company’s full-wafer contactors are designed specifically for 300 mm wafers, the company also offers full-wafer contactors for tiny wafers such as 3" VCSEL wafers for ultra-high count applications. The company’s contactor is more intricately designed when compared to traditional probe cards, as it is used in operations involving high temperatures of the order of up to 170° C such as for automotive wafer level burn-in applications, Buck said.
Source: http://www.aehr.com