Posted in | News | Nanoelectronics

El-Mul's E-Beam On-A-Chip Technology Wins Award for Outstanding Technology Innovation

Nov 27 2008

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El-Mul's E-Beam On-a-Chip™ platform has been recognized by the respected research firm Frost & Sullivan for outstanding technology innovation.

The 2008 Frost & Sullivan Award spotlights
El-Mul's device as cold field emission sources for SEM, TEM and FIB instruments used in analytical labs and semiconductor manufacturing. El-Mul is testing a prototype device, expected to result in a paradigm shift for the industrial manufacture of electron sources.

"El-Mul's patented approach combines high E-beam brightness with a narrower energy spread for near-laminar results," cites Frost & Sullivan senior research analyst Krishnakumar Srinivasan. "E-Beam On-a-Chip™ is especially attractive as a way to dramatically reduce energy consumption in many devices that currently use E-beams."

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