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Results 51 - 60 of 546 for Cantilevers
  • WITec GmbH
    Supplier Profile
    WITec GmbH pioneered 3D Raman imaging and correlative microscopy and continues to lead the industry with a product portfolio that offers speed, sensitivity and resolution without compromise. Raman,...
  • Bruker’s Hysitron TriboScope®: Enhanced Characterization Capabilities for AFM
    Equipment
    The Hysitron TriboScope® from Bruker delivers quantitative, rigid-probe nanoindentation and nanotribological characterization features to the field of atomic force microscopy.
  • Super Sharp 1nm NT-MDT AFM Probes from Scanwel
    Equipment
    Super sharp diamond-like carbon (DLC) tips with typical curvature radius 1nm are extremely useful for obtaining high resolution on objects with sizes of several nanometers. DLC tips have very long...
  • Applied Nanostructures Doped Diamond Probes
    Equipment
    Applied Nanostructures Doped Diamond Probes offers a unique combination of hardness and conducting tip. These probes are nanofabricated using highly doped single crystal silicon with unparalleled...
  • Applied Nanostructures Silicon Probes
    Equipment
    Applied Nanostructures silicon probes are available in different configurations such as long and short cantilever for tapping and non-contact mode applications, multi-cantilever probes for force...
  • Molecular Vista
    Supplier Profile
    Molecular Vista designs, develops, and provides tools that allow its customers to probe and understand matter at the molecular level through quantitative visualization. Its first product, VistaScope,...
  • Danish Micro Engineering A/S
    Supplier Profile
    DME - Danish Micro Engineering A/S is one of the oldest manufacturers of Scanning Probe Microscopes (see History of DME) and since 1989 active in nanotechnology. Our instruments are characterized by...
  • Plateau Tip Silicon-SPM-Probes from NANOSENSORS
    Equipment
    The Plateau Tip series based on the well-established NANOSENSORS™ Silicon-SPM-Probes exhibit an intentionally blunt tip with a well-defined circular end-face located at the free end of a...
  • Using Atomic Force Microscopy to Non-Destructively Image Surface of Biological Cell
    News - 20 Apr 2010
    Atomic force microscopy, a tactile-based probe technique, provides a three-dimensional nanoscale image of a material by gliding a needle-like arm across the material's surface. The core of AFM...
  • BNC Key Collaborators Recognised for Scientific Contributions to Nanomechanics
    News - 4 Dec 2009
    Bio Nano Consulting (BNC), the specialist bio-nanotechnology product development consultancy, is delighted to announce that one of their key collaborators has been specifically recognised for her...

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