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Results 11 - 20 of 1022 for Atomic Force Microscopy
  • Supplier Profile
    As a daughter company of  OPTOPHASE's group, PIEZOCONCEPT is the leading provider of nanopositioners dedicated to applications such as Super Resolution Microscopy, Optical Trapping...
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    Nanoscale science and technology group at the IBM T. J. Watson Research Center, Yorktown Heights, New York. Our group uses scanning tunneling microscopy (STM) and atomic force microscopy (AFM)...
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    Bruker Nano Surfaces provides high-performance, specialized analysis and testing technology for the widest range of research and production applications. Our broad portfolio of 2D and 3D surface...
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    Since the late 1990's Novascan has been a nanotechnology company that specializes in atomic force microscopy (AFM). Our products include typical Atomic Force Microscopes as well as specialized...
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    Nanotechnology is our field. Precision is our tradition. Innovation is our key instrument. That's why we are located in Switzerland, one of the most powerful and innovative areas in...
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    The mission of AFM Workshop is to develop and market innovative AFM products and components for research, development, OEMs and education. They support their customers with workshops on the...
  • Article - 20 Oct 2009
    Scanning Thermal Microscopy is an AFM imaging mode that maps changes in thermal conductivity across a sample's surface. Similar to other modes that measure material properties (LFM, MFM, EFM, etc.),...
  • Article - 9 May 2008
    Conductive AFM can simultaneously map the topography and current distribution of a sample. It is a measurement useful in a wide variety of material characterization applications including thin...
  • Article - 4 Mar 2011
    This report effectively demonstrates the ability of the FlexAFM to monitor morphological changes during electrodeposition of material on an electrode surface.
  • Article - 4 Mar 2011
    The abbreviation ePTFE stands for expanded polytetrafluorethylene, also known as expanded Teflon. In this application note, we analyzed an ePTFE membrane using the Nanosurf easyScan 2 AFM.