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Results 11 - 20 of 1170 for Atomic Force Microscopy
  • Magnetic Resonance Force Microscopy (MRFM) - A Great Leap Forward In Atomic Level Imaging
    Article - 1 Sep 2006
    Magnetic Resonance Force Microscopy (MRFM) is a relatively brand new imaging technique. The first image produced using MRFM was made in 1993.
  • Design, Components and Operation of an Atomic Force Microscope
    Article - 17 Feb 2006
    This article serves as a basic introduction to the design and operation of an atomic force microscope. It covers basic concepts and technologies that help understand the construction and operation of...
  • Nanoscale Tribology and Lubrication Analysis Using Atomic Force Microscopy
    Article - 16 Feb 2006
    Tribology plays a critical role in diverse technological areas. In the advanced technological industries of semiconductor and data storage, tribological studies help optimize polishing processes and...
  • Analysis of DVD Surface Topography Using Atomic Force Microscopy
    Article - 16 Feb 2006
    Directly measuring the topography of bits on DVD masters and replicas with an Atomic Force Microscope (AFM) is useful for quality control and process development.
  • AFM Probe with High-Q Factor for UHV Applications from Nanosensors - New Product
    Article - 28 Oct 2005
    Nanosensors have announced the Q30K-Plus, a novel scanning proximity probe with an outstanding Q-factor and enhanced signal to noise ratio for UHV applications. Posted October 28 2005
  • ScanAsyst Atomic Force Microscopy Imaging Mode from Bruker
    Video
    This video shows the ScanAsyst atomic force microscopy (AFM) imaging mode with automatic image optimization technology for use in Bruker’s premium AFM microscopes.
  • Digital Surf
    Supplier Profile
    Founded in 1989, Digital Surf is a leading provider of innovative solutions for micro and nano-surface metrology for use in research laboratory, industrial and production environments. Our company is...
  • Park Systems
    Supplier Profile
    Park Systems Corporation is the world’s leading manufacturer of atomic force microscopy systems for scientific research, nanoscale engineering, semiconductor fabrication and quality assurance....
  • Minus K Technology
    Supplier Profile
    Minus K® Technology, Inc. was founded in 1993 to develop, manufacture and market our state-of-the-art vibration isolation products based on our patented negative-stiffness-mechanism technology....
  • WITec GmbH
    Supplier Profile
    WITec GmbH pioneered 3D Raman imaging and correlative microscopy and continues to lead the industry with a product portfolio that offers speed, sensitivity and resolution without compromise. Raman,...

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