High resolution - AZoNano Search

NanoParticle Tracking Analysis (NTA) and Dynamic Light Scattering (DLS) - Comparison Between NTA and DLS

Article - 21 Jan 2009

NanoParticle Tracking Analysis (NTA) technique presents an interesting alternative to more typical Light Scattering techniques such as Dynamic Light Scattering (DLS). This note outlines the main...

Ultraviolet Microscopy of Patterned Semiconductors

Article - 28 Apr 2008

CRAIC Technologies has developed a broad spectral range microscope, the UVM-1 Ultraviolet Microscope. This unique microscope is designed for high resolution imaging throughout the ultraviolet, visible...

Analysing LCD Display Colour Masks Using Transmission Microspectroscopy

Article - 28 Apr 2008

CRAIC Technologies is the worlds leading developer of UV-visible-NIR range scientific instruments for microanalysis. This article looks at pixel-to-pixel variations of color masks by transmission...

Capovani Brothers – Buyer, Refurbisher and Seller of Used Semiconductor Manufacturing Equipment

Article - 31 May 2007

Capovani Brothers Inc. is at heart a buyer, refurbisher, and seller of used semiconductor manufacturing equipment. Capovani Brothers Inc. buy and sell typically ranges from vacuum pumps and power...

Regulatory Issues and Risk Assessment For The Safety Of Nanotechnology Based Medical Applications

Article - 23 Aug 2006

Safety aspects of NanoMedicine have to be properly and systematically addressed, and there has to be a clear positive benefit-to-risk ratio that will accompany the clinical implementation of products...

Economic Impact of Nanotechnology Based Healthcare Including Medical Devices, Medical Imaging and Pharmaceuticals

Article - 23 Aug 2006

NanoMedicine is not only important to Europe from the social and welfare aspects, but also for its economic potential. An analysis of the market segments for medical devices and drugs &...

Binding of Carbon Nanotubes Dispersed by Optical Tweezer on Silicon Surface

Article - 10 Jun 2006

Optical tweezers cum microdissection combi was used for dispersion of carbon nanotubes, The resultant nanotubes were functionalized with thionyl chloride and then successfully bound to functioalized...

Adaptive Mechanics Provides Multi Axis Motion with Sub Nanometer Flatness and Sub Rad Yaw, Pitch and Roll

Article - 6 Jun 2006

A novel, multi-axis error compensated, piezoelectric XY-stage with eight controlled PZT actuators and six high resolution capacitive displacement sensors is introduced.

Design, Components and Operation of an Atomic Force Microscope

Article - 17 Feb 2006

This article serves as a basic introduction to the design and operation of an atomic force microscope. It covers basic concepts and technologies that help understand the construction and operation of...

Defect Inspection and Analysis Using Atomic Force Microscopy

Article - 15 Feb 2006

The Atomic Force Microscope (AFM) employs a system of sensing the extremely small differences between the atomically sharp silicon probe and surface under investigation. This sensitivity is essential...