News - 14 Nov 2011
IBIS is a precision nanoindentation tester offering traceable calibration, robust design, closed loop operation, solid theoretical base, and unmatched accuracy, reliability and price. IBIS...
News - 9 Jun 2011
LOT represent some of the top names in Metrology instrumentation such as KLA Tencor and Park Systems. We are currently offering the following promotions for a limited period.
Park XE-100 -...
News - 29 Mar 2011
By Cameron Chai
Leatherhead, UK-based LOT Orel showcased the Park XE-100 AFM from Park Systems at its premises in Leatherhead between May 11 and 13.
The event presented both end...
News - 8 Dec 2010
Nuance™ TRIO is the newest addition to the Nuance product family. TRIO
enables simple image capture of any three chromogens or three fluorophores in
its spectral range. Additionally,...
News - 23 Jun 2010
are proud to be recently appointed as the UK/Ireland distributor for KLA Tencor
Stylus and Optical Surface Profilers.
The range includes:-
2D & 3D Stylus Profilers:
News - 18 May 2010
The Quantum Physical Property Measurement System (PPMS) EverCool-II™
dewar is the second generation of low-loss dewars with integrated Helium liquefier
for the PPMS system from Quantum...
News - 5 May 2010
provide Silicon Cantilevers for contact and non-contact modes, cantilever for
MFM, EFM, Force Modulation mode as well as High Aspect Ratio cantilevers. These
cantilevers are suitable...
News - 4 May 2010
now offer the Nanoscale IR from Anasys Instruments. This breakthrough technology
combines key elements of both infrared spectroscopy and atomic force microscopy
(AFM) to enable the...
News - 31 Mar 2010
Oriel Ltd has been appointed as distributor for Park Systems in the UK +
Park Systems is the technology leader of nanoscale measurements and systems
for both research and...
News - 23 Feb 2010
proudly announces the availability of NEW J A Woollam T-Solar™ Ellipsometer
- optimised to measure the widest range of Photovoltaic Thin Films.