Posted in | Nanoelectronics

Cascade Microtech Announces Set of New Probes and Accessories for Tesla on-Wafer Power Device Characterization System

Cascade Microtech, Inc. (NASDAQ: CSCD), a worldwide leader in the precise electrical measurement and test of integrated circuits (ICs) and other small structures, today announced a set of new probes and accessories for its Tesla on-wafer power device characterization system, making it fully compatible with the recently released Agilent B1505A power device analyzer. The combined solution offers an extended triaxial measurement range to accommodate low noise probing of power devices up to 2000 volts.

Emerging energy standards are driving demand for efficient power utilization, creating the need for accurate power device characterization in automotive, mobile devices, transportation, and power station manufacturing. There is a need to measure at increasing voltage and current levels when characterizing devices fabricated using new wide band gap materials such as silicon carbide (SiC) and gallium nitride (GaN). The award-winning Tesla system meets these demands by offering the industry's highest voltage and current range for on-wafer measurements up to 2000V triax / 3000V coax, and 60A pulsed / 20A continuous. Combined with Agilent's B1505A power device analyzer, the new Tesla probes have been designed to take full advantage of the performance of the B1505A, meeting the requirements of more advanced device characterization applications.

"Power devices are prolific in today's semiconductor industry. Our customers are constantly striving to improve the efficiency of these critical IC components," says Geoff Wild, Chief Executive Officer, Cascade Microtech, Inc. "The Tesla system facilitates on-wafer C-V, IV and breakdown measurements, which in turn enables faster development cycles at an overall lower cost-of-test versus packaged test. Unlike other solutions, the Cascade Microtech Tesla system allows users to realize the full potential of their B1505A, with the maximum range of voltage, current and application compatibility."

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