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Results 461 - 470 of 1618 for Electrical conductivity
  • Article - 31 May 2004
    Bjorn Timmer from the University of Twente has developed a lab-on-a-chip device that will detect ammonia in human breath which can be an indicator of a bacterial infection in the stomach. Posted May...
  • Equipment
    Probes for CONTACT/SEMICONTACT modes CSG30 series, resonant frequency 26-76kHz, force constant 0.6-2 N/m. Specially designed for the applications when it's not clearly defined which mode should be...
  • Equipment
    Super sharp diamond-like carbon (DLC) tips with typical curvature radius 1nm are extremely useful for obtaining high resolution on objects with sizes of several nanometers. DLC tips have very long...
  • Equipment
    The Pointprobe is a versatile silicon AFM probe for very high resolution imaging and fits to all well-known commercial SPMs (Scanning Probe Microscopes). It consists of a single crystal silicon...
  • Equipment
    The Pyrex-Nitride probes have silicon nitride cantilevers with very low force constants and integrated oxide sharpened, pyramidal tips with a height of 3.5 µm. The tip is located 4µm behind the free...
  • Article - 16 Jan 2004
    Three scientists recently received one of nine new $200,000 federal grants for nano research from The Natural Sciences and Engineering Research Council (NSERC). Posted November 28 2003
  • Equipment
    SensaProbes are highly recommended for early stage scans and student use. Applied NanoStructures SensaProbes can be used for tapping and contact mode and force modulation applications.
  • Equipment
    Applied Nanostructures Doped Diamond Probes offers a unique combination of hardness and conducting tip. These probes are nanofabricated using highly doped single crystal silicon with unparalleled...
  • Equipment
    Applied Nanostructures silicon nitride probes contains the world's first truly hybrid probes. They are also the only commercially available probes that allow for high resolution imaging in fluid...
  • Equipment
    Applied Nanostructures silicon probes are available in different configurations such as long and short cantilever for tapping and non-contact mode applications, multi-cantilever probes for force...

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