Article - 11 Jan 2018
The material gallium nitride (GaN) is extensively used in optoelectronic devices such as Light Emitting Diodes (LEDs).
Article - 12 May 2016
Frequency modulation PeakForce Kelvin Probe Microscopy (FM- KPFM) and amplitude modulation KPFM (AM-KPFM) are the two critical KPFM detection methods. This article provides an intuitive and...
Article - 17 Jun 2015
After the introduction of the TappingMode™, Bruker’s exclusive PeakForce Tapping® is a very important scientific advancement in atomic force microscope (AFM) technology.
Article - 25 May 2006
This paper describes new hybrid systems designs such as the combination of piezoelectric and motorized systems with a long travel ranges and extremely high resolution, controlled by one sensor and one...
Article - 13 Nov 2003
Applied NanoMaterials, Inc. has announced that it will manufacture a new kind of inorganic nanotube for products such as advanced generation high resolution flat panel displays and atomic force...
Article - 17 Aug 2005
Characterization and analysis tools let material scientists examine the behavior and properties of materials at the nanoscale.
Article - 25 Sep 2006
Several lithographic techniques are used for patterning in the nanoscale region. Light coupling mask (LCM) nanolithography is a variation on the commonly used technique of photolithography.
Article - 8 Feb 2006
The kSA MOS Ultra-Scan is a flexible, high-resolution scanning curvature and stress measurement system. Based on proven kSA MOS technology, this fully integrated ex-situ tool maps the curvature of...
Article - 7 Jul 2005
The successful growth of nanotechnology can only occur if the right tools and instruments are available. Current and future markets, global competition, technical challenges faced by manufacturers,...
Article - 19 Jun 2017
Precision Motorized Positioning Systems are experiencing rapid advancement.