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Results 1 - 10 of 285 for Ion Beam Analysis
  • Supplier Profile
    2022 marks Hiden Analytical’s 40th year of continuous and independent operation in the field of mass spectrometry.  Driven by customer and application focussed innovation, a unique and...
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    The Microscopy business group at Carl Zeiss is the world's only manufacturer of light, X-ray, electron, and ion microscopes. The company's extensive portfolio enables industrial, research and...
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    Gatan, Inc. is the world's leading manufacturer of instrumentation and software used to enhance and extend the operation and performance of electron microscopes. Gatan's products, which are...
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    COXEM is a leading manufacturer of Scanning Electron Microscopes (SEM) utilizing technology developed with KRISS, the Korean Research Institute for Science and Standards. COXEM’s flagship...
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    Oxford Instruments NanoAnalysis provides leading-edge tools that enable materials characterisation and sample manipulation at the nanometre scale. Used on electron microscopes and ion-beam systems,...
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    Specac manufactures an extensive range of FTIR Accessory, IR Polarizer, and Pellet Press Products for Atomic and Molecular Spectroscopy. These products include ATR Accessories, Specular Reflectance...
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    Particle Measuring Systems has 35 years experience designing, manufacturing, and servicing microcontamination monitoring instrumentation and software used for detecting particles in air, liquid, and...
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    Malvern Panalytical technologies are used by scientists and engineers in a wide range of industries and organizations to solve the challenges associated with maximizing productivity, developing better...
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    SEMILAB provides state-of-the-art metrology solutions for semiconductor device manufacturers in both the in-line and R&D segments, and is a strategic metrology supplier of leading wafer...
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    XEI Scientific, Inc. was founded in 1991 by Ronald Vane to provide an effective way to gently clean scanning electron microscopes (SEMs), focused ion beams (FIBs) and other vacuum systems. XEI...

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