Smart Filter Technology was developed and proven in the late 1990's, when David Fries of the University of South Florida built the first photolithography exposure system that utilized this technology....
Article - 26 Mar 2012
Height measurement by AFM is crucial in metrology, however it would also benefit from the capability to perform sidewall roughness imaging.
News - 7 Apr 2010
Life BioScience, Inc. (LBSI) has launched a new Life MicroFab™ Division that provides a broad range of micro-fabrication services for devices made in APEX™ Glass, APEX™ Ceramic, Silicon, Pyrex™,...
News - 28 Sep 2009
SUSS MicroTec (FWB:SMH)(GER:SMH), a leading supplier of innovative process and test solutions for the semiconductor industry and related markets, announced today that it is engaging with one of the...
News - 20 Jun 2008
Toppan Printing Co., Ltd. today announced that it has entered into a new development agreement with IBM that covers the last phase of 32nm photomask process development, and all phases of 22nm...
News - 6 Feb 2015
Toshiba today announced that it has entered into a definitive agreement with SK hynix on joint development of Nano Imprint Lithography (NIL). Engineers from the two companies will start development of...
News - 29 Oct 2013
EV Group (EVG), a leading supplier of wafer bonding and lithography equipment for the MEMS, nanotechnology and semiconductor markets, today announced that it has delivered an EVG®6200...
Article - 24 Feb 2004
Ultratech, Inc., a leading supplier of photolithography systems used to manufacture semiconductors and nanotechnology devices, today announced that it has received an order from Tokyo Ohka Kogyo Co.,...
News - 7 Dec 2010
Viruses have a bad rep—and rightly so. The ability of a virus to quickly and precisely replicate itself makes it a destructive scourge to animals and plants alike.
Now an interdisciplinary...
Article - 20 Mar 2018
There has been a considerable expansion in optical metrology techniques and applications during the decade that has passed since the publication of the first edition of the Optics Encyclopedia. Much...