AI-Driven Nanomechanical AFM Analysis in Multi-Compartment Systems

Join Bruker Nano for an exclusive webinar featuring Dr. Upnishad Sharma from ETH Zurich as it explores AI-assisted nanomechanical analysis of biological samples in complex, multi-compartment environments using atomic force microscopy (AFM).

Cutting-edge advancements in AFM allow high-resolution imaging and mechanical measurements directly in multiwell cell culture plates—boosting experimental versatility, speed, and statistical relevance.

What You Will Discover:

• Artificial intelligence (AI)-guided operation with machine learning for autonomous feature detection and measurement
• Full integration with advanced optical microscopy systems
• High-throughput analysis of live cells, tissues, 3D cultures, and organoids under near-native conditions

There will be a live demonstration, where Bruker Nano will perform nanomechanical AFM measurements using the new CellWizard Stage.

Please download the program flyer for details.