The Hysitron TriboScope® from Bruker delivers quantitative, rigid-probe nanoindentation and nanotribological characterization features to the field of atomic force microscopy. The Hysitron TriboScope interfaces with Bruker’s Dimension Icon®, MultiMode® 8 and Dimension Edge™ AFMs to expand the characterization features of these microscopes. By employing a rigid test probe, the TriboScope removes the fundamental limitations, complexity and variability related to cantilever-based measurements to provide quantitative and repeatable mechanical and tribological characterization over nanometer-to-micrometer length scales
Quantitative, Reliable and Repeatable
Expanding the Capabilities of our Industry-Leading AFMs
The TriboScope quickly interfaces to Bruker’s Dimension Icon, MultiMode 8 and Dimension Edge systems.
![Industry-Leading AFMs](https://d1otjdv2bf0507.cloudfront.net/image-handler/picture/2017/10/4898-1.jpg)
The TriboScope Advances Research with Innovative Testing Modes
- Quasi-Static Nanoindentation - Perform quantitative measurement of elastic modulus, hardness, stress relaxation, creep and fracture toughness of localized microstructures, small surface features, interfaces and thin films.
- Scanning Wear - Raster scan the test probe over the sample surface at a user-definable force set point for quantitative wear resistance characterization at the nanoscale.
- In-Situ SPM Imaging - Employ the same test probe for testing and topographic imaging for nanometer precision test placement accuracy and the ability to characterize post-test material deformation behavior.
- nanoDMA III - Dynamic Nanoindentation - Continuously measure elastic-plastic and viscoelastic properties as a function of frequency, indentation depth and time with Bruker’s nanoDMA® III option.
- NanoScratch - Perform friction coefficient, quantitative scratch/mar resistance and thin film adhesion measurements with Bruker’s exclusive 2D lateral force transducer technology.
![Industry-Leading AFMs](https://d1otjdv2bf0507.cloudfront.net/image-handler/picture/2017/10/4898-2.jpg)
The Rigid-Probe Advantage
Most AFMs utilize a compliant cantilever to conduct mechanical or tribological testing, posing significant challenges in separating a cantilever’s flexural and rotational stiffness from the material’s response to applied stress. The TriboScope utilizes a rigid test probe assembly, allowing direct control and measurement of applied force and displacement during the test.
![The Rigid-Probe Advantage](https://d1otjdv2bf0507.cloudfront.net/image-handler/picture/2017/10/Triboscope-Cantilever-Image.jpg)
Electrostatic Actuation
The TriboScope utilizes proprietary electrostatic force actuation and capacitive displacement sensing transducer technology to deliver industry-leading low thermal drift and noise floors for characterizing properties to the bottom of the nanoscale.
![Electrostatic Actuation](https://d1otjdv2bf0507.cloudfront.net/image-handler/picture/2017/10/Triboscope-Displacement-Image-v2.jpg)
Force and Displacement Feedback Control
The TriboScope functions under displacement control or closed-loop force control. Utilizing a 78 kHz feedback loop rate, the TriboScope can respond to rapid material deformation transient events and dependably reproduce the test function specified by the operator.
![Force and Displacement Feedback Control](https://d1otjdv2bf0507.cloudfront.net/image-handler/picture/2017/10/Triboscope-Graph-Image.jpg)
TriboScope Features
- Industry-leading transducer technologies offer measurement of elastic modulus, creep, fracture toughness, stress relaxation, hardness and viscoelastic properties over nanometer-to-micrometer length scales
- Quantitative, rigid-probe characterization removes the doubts and complexities intrinsically caused by cantilever-based nanoindentation and nanotribological testing techniques
- An intuitive mechanical interface simplifies integration with standard commercially available AFMs, including Bruker’s Dimension Edge, Dimension Icon and MultiMode 8 systems
- Enables quantitative nanomechanical and nanotribological characterization of the widest range of materials, from soft polymers to ultra-thin diamond thin films
- Proprietary capacitive transducer and Performech® control technologies offer better control over the nanoindentation process and deliver industry-leading force and displacement noise floors
- In-situ SPM imaging provides nanometer-precision test placement accuracy and observation of post-test material deformation behavior
![TriboScope](https://d1otjdv2bf0507.cloudfront.net/image-handler/picture/2017/10/4898-3.jpg)
Specifications
. |
. |
Standard Configuration |
Testing Modes |
Quasi-Static Nanoindentation, In-Situ SPM Imaging, Scanning Wear |
Normal Force |
Maximum Force: 10 mN
Noise Floor: <30 nN
Resolution: 1 nN |
Normal Displacement |
Maximum Displacement: 5 µm
Noise Floor: <0.2 nm
Resolution: 0.006 nm
Drift Rate: <0.05 nm/sec |
Optional Configurations |
nanoDMA Ill |
Testing Modes |
Dynamic Nanoindentation, Quasi-Static Nanoindentation, In-Situ SPM Imaging, ScanningWear |
Dynamic Specifications |
Frequency Range: 0.1 Hz - 300 Hz
Maximum Dynamic Force Amplitude: 5 mN
Maximum Dynamic Displacement Amplitude: 2.5 µm |
NanoScratch |
Testing Modes |
NanoScratch, Quasi-Static Nanoindentation, In-Situ SPM Imaging, ScanningWear
Maximum Displacement: 15 µm
Displacement Noise Floor: <2 nm |
Lateral Specifications |
Maximum Force: 2 mN
Force Noise Floor: <3.5 µm |