Bruker’s Hysitron® PI 95 TEM PicoIndenter® is the first full-fledged depth-sensing indenter capable of direct-observation nanomechanical testing inside a transmission electron microscope (TEM).
The Hysitron PI 95 has been carefully designed for compatibility with JEOL, FEI, Hitachi, and Zeiss microscopes.
With this side-entry instrument, it is not only possible to image the mechanical response of nanoscale materials, but also acquire quantitative mechanical data simultaneously. The integrated video interface allows for synchronization between the load-displacement curve and the corresponding TEM video.
The Hysitron PI 95 is also highly customizable and upgradable with available heating, electrical, or tribological (scratch) upgrade options to accommodate an expansive range of current and future materials research.
The Hysitron PI 95 TEM PicoIndenter is uniquely suited for the investigation of nanoscale phenomena. Performing these types of studies in the TEM can provide unambiguous differentiation between the many possible causes of force or displacement transients which may include dislocation bursts, phase transformations, spalling, shear banding or fracture onset.
- Unique miniature and MEMS transducer technologies designed specifically for quantitative nanomechanical testing in most major TEM models
- Load or displacement controlled testing modes for nanoindentation, compression, tension, bending, or scratch testing
- 3D piezoelectric actuator for fine control of test placement and tip-sample alignment in all three directions
- User-changeable conductive probes available in a wide variety of geometries
- Performech® Advanced Control Module with 78 kHz feedback rate and data acquisition up to 38 kHz to capture transient events, such as dislocation bursts
- Proprietary Q-Control mode actively dampens transducer oscillations in the vacuum environment
- Mechanical data synchronization with TEM video with the TriboScan™ software suite