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Results 21 - 30 of 4620 for Microscopes
  • Supplier Profile
    KLA Instruments encompasses a broad portfolio of surface metrology and defect inspection solutions within the KLA Corporation. KLA Instruments is divided into the Labs group of primarily benchtop...
  • Supplier Profile
    Founded in 2007, our mission at ICSPI is to expand access to nanoscale measurement tools. We make desktop atomic force microscopes (AFMs) with unmatched time-to-results, ease of use and...
  • Supplier Profile
    Bruker Inc. is a globally leading manufacturer of analytical systems for the materials and life sciences. The Electron Microscope Analyzer range from Bruker Nano GmbH, headquartered in Berlin,...
  • Supplier Profile
    For over 20 years, DME has successfully dealt with the development and manufacturing of atomic force microscopes. In this connection DME's key points are easy usability, manufacturing by...
  • Equipment
    Find out about WITec's flexible and consistent inverted raman imaging microscope, the alpha300 Ri, by reading here.
  • Article - 27 Apr 2005
    Scanning Probe Microscopy (SPM) is a powerful tool used to study surfaces and surface properties at nanometre resolution. Different operating modes for Scanning Tunneling Microscopes (STM) and Atomic...
  • Supplier Profile
    Queensgate Instruments was founded in 1979 and span out from a ground-breaking research programme at Imperial College, London. Queensgate Instruments quite literally "wrote the book" on...
  • Supplier Profile
    We are a nanoscience and nanotechnology research group in the School of Materials Science and Engineering of the Georgia Institute of Technology. Our recent research is focused on the fundamental...
  • Supplier Profile
    CSInstruments, a French manufacturer of scientific equipment, specializes in developing Atomic Force Microscopes (AFMs) and various accessories for existing AFMs, such as the Nano-Observer AFM,...
  • Supplier Profile
    XEI Scientific, Inc. was founded in 1991 by Ronald Vane to provide an effective way to gently clean scanning electron microscopes (SEMs), focused ion beams (FIBs) and other vacuum systems. XEI...

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