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Results 71 - 80 of 758 for Scanning probe microscopes
  • Schaefer Technologie GmbH
    Supplier Profile
    The Schaefer Group distributes over Continental Europe equipment for basic as well as applied research, the industry and education, in the field of micro- to nano-technologies and surface engineering...
  • A.P.E. Research
    Supplier Profile
    A.P.E. Research develops and produces very high-resolution probe microscopes (SPM), systems and instrumentation for surface and condensed matter physics. The company was established in 1996 by five...
  • Dept. of Chemistry Rice University
    Supplier Profile
    The department provides a uniquely stimulating environment for scientific discoveries: we are world leaders in nanotechnology, home to two Nobel laureates and three members of the National Academy of...
  • Nanoscience Instruments
    Supplier Profile
    Nanoscience Instruments is your one source for a variety of AFM systems, probes, accessories, and related nanoscience tools. Products include the easy-to-use Nanosurf® easyScan 2 AFM/STM and...
  • Ohio University
    Supplier Profile
    Ohio University has been cited for academic quality and value by such publications as U.S. News and World Report, America's 100 Best College Buys, Princeton Review's Best Colleges, and...
  • Lightwave-Driven Electron Microscope Probes Atom-Sized Graphene Nanoribbons
    News - 25 Nov 2021
    A team of researchers at Michigan State University have utilized lightwave-driven terahertz scanning tunneling microscopy and spectroscopy to probe 7-atom-wide armchair graphene nanoribbons (7-AGNRs)...
  • The DME CompactGranite AFM System
    Equipment
    The DME CompactGranite is a granite sample stage for SPM. With a modular design that lends itself well to upgrades and additions, the stage enables strong AFM performance whilst maintaining...
  • ProberStation 200—A Large Sample AFM System
    Equipment
    Semilab’s ProberStation 200 large sample SPM stage allows for the automation of AFM measurements while maintaining efficiency and cost-effectiveness. The modular design allows for other important...
  • Design and Characterisation of Nanometer Precision Mechanisms
    Article - 9 Dec 2005
    To meet the demands of ultra-precision positioning and scanning, a series of precision positioning mechanisms have been developed by Queensgate Instruments. They combine piezoelectric and NanoSensor...
  • Carbon Nanotubes - Measuring the Mechanical, Electrical and Field Emission Properties of Nanotubes
    Article - 25 Jul 2005
    Transmission Electron Microscopy (TEM) methods can be used to measure the mechanical, electrical and field emission properties of individual carbon nanotubes. This overview highlights the in-situ TEM...

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