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Results 1 - 10 of 1557 for Optical analysis
  • Supplier Profile
    Bruker Nano Surfaces and Metrology provides high-performance, specialized analysis and testing technology for the widest range of research and production applications. Our broad portfolio of 2D and...
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    Nanosurf is a leading manufacturer of atomic force microscopes and scanning tunneling microscopes. Our full range of AFM and STM products is trusted by professionals worldwide to help them visualize,...
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    Malvern Panalytical technologies are used by scientists and engineers in a wide range of industries and organizations to solve the challenges associated with maximizing productivity, developing better...
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    WITec GmbH pioneered 3D Raman imaging and correlative microscopy and continues to lead the industry with a product portfolio that offers speed, sensitivity and resolution without compromise. Raman,...
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    CPI is the driving force behind a number of the North East's strategic R&D initiatives. Each of CPI' programmes focuses on bringing cutting edge technology research to the region, which...
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    Park Systems Corporation is the world’s leading manufacturer of atomic force microscopy systems for scientific research, nanoscale engineering, semiconductor fabrication and quality assurance....
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    KLA Instruments encompasses a broad portfolio of surface metrology and defect inspection solutions within the KLA Corporation. KLA Instruments is divided into the Labs group of primarily benchtop...
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    Photon etc. is a renowned Canadian-Quebec company, located in the heart of Montreal's innovative district, specializing in the design and manufacturing of hyperspectral and infrared imaging...
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    ZYGO designs, manufactures, and distributes high-end optical systems and components for metrology and end-user applications. ZYGO's metrology systems are based on optical interferometry measuring...
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    Phenom. Making SEM personal Phenom, world’s fastest Desktop Scanning Electron Microscope takes your imaging performance to a higher level. The Phenom desktop scanning electron microscope...